Stevie, F.A. ; Persson, E. ; DeBusk, D.K. ; Savchuk, A. ; Hoff, A.M. ; Edelman, P. ; Lagowski, J.
Pub. info.:
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.357-364, 1997. Pennington, NJ. Electrochemical Society
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.205-208, 1988. Pittsburgh, Pa.. Materials Research Society
Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A.. pp.175-180, 1985. Pittsburgh, Pa.. Materials Research Society
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.153-168, 1985. Pittsburgh, Pa.. Materials Research Society
L:I, C.-J. ; Sun, Q. ; Lagowski, J. ; Gatos, H. C.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.441-446, 1985. Pittsburgh, Pa.. Materials Research Society
Nauka, K. ; Walukiewicz, W. ; Lagowski, J. ; Gatos, H. C.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.291-296, 1985. Pittsburgh, Pa.. Materials Research Society
Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.. pp.21-26, 1986. Pittsburgh, Pa.. Materials Research Society
Skowronski, M. ; Lin, D. G. ; Lagowski, J. ; Pawlowicz, L..M. ; Ko, K. Y. ; Gatos, H. C.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.207-212, 1985. Pittsburgh, Pa.. Materials Research Society
Kontkiewicz, A. M. ; Lagowski, J. ; Dexter, M. ; Edelman, P.
Pub. info.:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.439-, 1994. Pittsburgh. MRS - Materials Research Society
Sen, S. ; Kontkiewicz, A. J. ; Kontkiewicz, A. M. ; Nowak. G. ; Siejka, J. ; Sakthivel, P. ; Ahmed, K. ; Mukherjee, P. ; Witanachchi, S. ; Hoff, A. M. ; Lagowski, J.
Pub. info.:
Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A.. pp.369-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
Lagowski, J. ; Hoff, A. ; Jastrzebski, L. ; Edelman, P. ; Esry, T.
Pub. info.:
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.437-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Edelman, P. ; Lagowski, J. ; Savchouk, A. ; Hoff, A. ; Jastrzebski, L. ; Persson, E.
Pub. info.:
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.443-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Wilson, M. ; Lagowski, J. ; Savtchou, A. ; Marinskiy, D. ; Jastrzebski, L. ; D'Amico, J.
Pub. info.:
Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.345-, 2000. Warrendale, PA. MRS-Materials Research Society
Marinskiy, D. ; Lagowski, J. ; Wilson, M. ; Savtchouk, A. ; Jastrzebski, L. ; DeBusk, D.
Pub. info.:
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.225-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Ostapenko, S. ; Henley, W. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
Pub. info.:
Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.. pp.405-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Ostapenko, S. ; Jastrzebski, L. ; Lagowski, J. ; Smeltzer, R. K.
Pub. info.:
Flat panel display materials II : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.201-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Faifer, V. ; Edelman, P. ; Kontkiewicz, A. ; Lagowski, J. ; Hoff, A. ; Dyukov, V. ; Pravdivtsev, A. ; Kornienko, I.
Pub. info.:
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands. pp.73-82, 1995. Pennington, NJ. Electrochemical Society
Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.. 2001. Warrendale, PA. Materials Research Society
Savtchouk, A. ; Oborina, E. ; Hoff, A.M. ; Lagowski, J.
Pub. info.:
Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003. pp.755-758, 2004. Uetikon-Zuerich. Trans Tech Publications
Becla, P. ; Witt, A. G. ; Lagowski, J. ; Walukiewicz, W.
Pub. info.:
Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.. pp.47-, 1995. Pittsburgh, PA. MRS - Materials Research Society