Sasaki, I. ; Nakatani, R. ; Yoshida, T. ; Otaki, K. ; Endo, Y. ; Kawamura, Y. ; Yamamoto, M. ; Takenaga, T. ; Aya, S. ; Kuroiwa, T. ; Beysen, S. ; Kobayashi, H.
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Advanced structural and functional materials design : proceedings of the International Symposium on Advanced Structural and Functional Materials Design, Osaka, Japan, November 10th-12th, 2004. pp.171-176, 2006. Switzerland. Trans Tech Publications
Ozawa, E. ; Kawakami, Y. ; Yoshida, T. ; Iwashina, M. ; Takahashi, K.
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Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.232-237, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nishizawa, J. ; Murai, A. ; Oizumi, T. ; Kuraboyashi, T. ; Kanamoto, K. ; Yoshida, T.
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Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium. pp.381-388, 2001. Pennington, N.J.. Electrochemical Society
Wang, C.-R. ; Kai, I. ; Tomiyama, I. ; Yoshida, T. ; Kobayashi, V. ; Nishibori, E. ; Takata, M. ; Sakata, M. ; Shinohara, H.
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Fullerenes 2000 : chemistry and physics of fullerenes and carbon nanomaterials, proceedings of the International Symposium. pp.336-341, 2000. Pennington, N.J.. Electrochemical Society
Kanda, N. ; Furukawa, R. ; Ishibashi, M. ; Kunitomo, M. ; Homma, T. ; Takahashi, M. ; Uemura, T. ; Kanai, M. ; Kubo, M. ; Ogata, K. ; Yoshida, T. ; Yamamoto, H. ; Ohji, Y.
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Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.129-, 2000. Warrendale, PA. MRS-Materials Research Society
Aktsipetrov, O. A. ; Dolgova, T. V. ; Fedyanin, A. A. ; Kapra, R. V. ; Murzina, T. V. ; Inoue, M. ; Yoshida, T. ; Kobayashi, D. ; Nishimura, K. ; Uchida, H.
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Magneto-optical materials for photonics and recording : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A.. pp.57-64, 2005. Warrendale, Pa.. Materials Research Society
Inazumi, Y. ; Yoshida, T. ; Sakai, Y. ; Horita, Y.
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Visual communications and image processing 2002 : 21-23 January 2002, San Jose, USA. pp.1219-1229, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tanaka, M. ; Mizumoto, Y. ; Ohishi, M. ; Shirasaki, Y. ; Honda, S. ; Yasuda, N. ; Masunaga, Y. ; Ishihara, Y. ; Abe, K. ; Tsutsumi, J. ; Nakamoto, H. ; Kobayashi, Y. ; Yoshida, T. ; Morita, Y.
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Optimizing scientific return for astronomy through information technologies : 24-25 June 2004, Glasgow, Scotland, United Kingdom. pp.286-293, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tanaka, M. ; Mizumoto, Y. ; Ohishi, M. ; Shirasaki, Y. ; Honda, S. ; Yasuda, N. ; Masunaga, Y. ; Ishihara, Y. ; Abe, K. ; Tsutsumi, J. ; Nakamoto, H. ; Kobayashi, Y. ; Yoshida, T. ; Morita, Y.
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Optical fabrication, metrology, and material advancements for telescopes : 24-25 June 2004, Glasgow, Scotland, United Kingdom. pp.286-293, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hanaoka, T. ; Fujimoto, S. ; Yoshida, T. ; Kamei, K. ; Harada, M. ; Suzuki, Y. ; Yokoyama, S. ; Minowa, T.
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Carbon dioxide utilization for global sustainability : proceedings of the 7th International Conference on Carbon Dioxide Utilization, Seoul, Korea, 12-16 October 2003. pp.103-108, 2004. Amsterdam, The Netherland. Elsevier
Maruyama, H. ; Ohtake, H. ; Hayashida, T. ; Yamada, M. ; Kitamura, K. ; Arai, T. ; Tanioka, K. ; Etoh, T. G. ; Namiki, J. ; Yoshida, T. ; Maruno, H. ; Kondo, Y. ; Ozaki, T. ; Kanayama, S.
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26th International Congress on High-Speed Photography and Photonics : 20-24 September 2004, Alexandria, Virginia, USA. pp.244-249, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Huang, H. ; Eguchi, K. ; Kambara, M. ; Yoshida, T.
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PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.2883-2886, 2005. Uetikon-Zuerich. Trans Tech Publications
Nozaki, Y. ; Yoshida, T. ; Takahashi, M. ; Matsuda, S. ; Saga, T. ; Katsu, T.
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Proceedings of the Sixth European Space Power Conference (ESPC) : 6-10 May 2002, Porto, Portugal. pp.457-462, 2002. Noordwijk. ESA Publications Division
Uchiyama, H. ; Hamada, E. ; Takahashi, T. ; Sato, K. ; Takahashi, Y. ; Kanazawa, I. ; Oshima, N. ; Suzuki, T. ; Yoshida, T. ; Takeuchi, S.
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Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany. pp.182-184, 2001. Zuerich, Switzerland. Trans Tech Publications
A collection of technical papers : AIAA Guidance, Navigation and Control Conference, Austin, Texas, 11-14 August 2003. v. 4 pp.2574-2581, 2003. Reston, Va.. American Institute of Aeronautics and Astronautics
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AIAA Paper : AIAA Guidance Navigation and Control Conference
Miyakawa, K. ; Ohkawa, Y. ; Matsubara, T. ; Takahata, T. ; Suzuki, S. ; Kubota, M. ; Egami, N. ; Tanioka, K. ; Ogusu, K. ; Kobayashi, A. ; Hirai, T. ; Kawai, T. ; Hombo, M. ; Yoshida, T.
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Sensors and Camera Systems for Scientific and Industrial Applications VI. pp.26-34, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kinoshita, A. ; Kitamura, F. ; Horie, M. ; Yoshida, T.
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Metrology, Inspection, and Process Control for Microlithography XIX. pp.174-182, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Monoi, M. ; Sasaki, S. ; Nakano, Y. ; Tsuruta, H. ; Yoshida, T. ; Hayakawa, Y. ; Matsuura, M. ; Takahashi, M. ; Kashiwagi, M.
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Sensors and Camera Systems for Scientific and Industrial Applications VI. pp.169-176, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering