1.

Conference Proceedings
Conference Proceedings
1. Evaluation of an optical surface using nanometrology in optical manufacturing technology
Li,J. ; Zhao,A. ; Li,X. ; Zhang,X. ; Wang,M.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.566-568,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
2.

Conference Proceedings
Conference Proceedings
2. Satellite remote sensing of biomass burning,dust storms,carbon monoxide,and radiative fluxes: regional and global analysis
Christopher,S.A. ; Wang,M. ; Kliche,D.V. ; Chou,J. ; Li,X. ; Welch,R.M.
Pub. info.: Satellite remote sensing of clouds and the atmosphere II : 23-25 September 1997, London, UK.  pp.291-294,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3220
3.

Conference Proceedings
Conference Proceedings
3. Testing method on nanometer-grade true microprofile of optical surface (Invited Paper)
Li,J. ; Li,X. ; Ying,A. ; Xiao,S. ; Wang,M. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.276-281,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
4.

Conference Proceedings
Conference Proceedings
4. Distance scale calibration of optical fiber OTDR
Fang,Y. ; Qian,J. ; Wang,M. ; Li,X. ; Li,T.
Pub. info.: Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China.  pp.108-113,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3552