1.

Conference Proceedings
Conference Proceedings
1. Trapping of Lattice Defects at 111In Atoms in Cold-Worked Copper
Deicher,M. ; Grubel,G. ; Reiner,W. ; Wichert,Th.
Pub. info.: Vacancies and interstitials in metals and alloys : Proceedings of the International Conference on Vacancies and Interstitials in Metals and Alloys held in Berlin, Germany, September 14-19, 1986.  Pt.2  pp.635-640,  1987.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 15-18
2.

Conference Proceedings
Conference Proceedings
2. Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon
Deicher,M. ; Grubel,G. ; Keller,R. ; Recknagel,E. ; Schulz,N. ; Skudlik,H. ; Wichert,Th.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.367-372,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
3.

Conference Proceedings
Conference Proceedings
3. Doping of ZnSe,ZnTe and CdTe with Group V Elements
Wolf,H. ; Burchard,A. ; Deicher,M. ; Filz,T. ; Jost,A. ; Lauer,St. ; Magerle,R. ; Ostheimer,V. ; Pfeiffer,W. ; Wichert,Th.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.309-314,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings
Conference Proceedings
4. Thermal Stability of Acceptor-Hydrogen Pairs in Silicon
Deicher,M. ; Grtibel,G. ; Keller,R. ; Recknagel,E. ; Schulz,N. ; Skudlik,H. ; Wichert,Th.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part3  pp.1045-1050,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
5.

Conference Proceedings
Conference Proceedings
5. On the Pairing between Indium and Carbon Atoms in Silicon
Ott,U. ; Wolf,H. ; Krings,Th. ; Wichert,Th. ; Haｦﾂlein,H. ; Sielemann,R. ; Deicher,M. ; Newman,R.C. ; Zulehner,W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1251-1256,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147