Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.241-245, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.200-203, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.204-207, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China. pp.415-418, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.463-472, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.29-33, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.103-107, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ge, Y. ; Guo, F. ; Wang, W. ; Yu, S. ; Shao, L. ; Zhu, Z. ; Lu, W.
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Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.515-518, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Xu, X. ; Guo, F. ; Lu, W. ; Yu, S. ; Ge, Y. ; Li, N.
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Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.510-514, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.183-193, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.378-386, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Guo, F. ; Xu, X. ; Li, C. ; Ge, Y. ; Yu, J. ; Xin, P. ; Zhu, R. ; Lai, Z. ; Zhu, Z. ; Lu, W.
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Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.506-509, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ruhl, J. E. ; Ade, P. A. R. ; Carlstrom, J. E. ; Cho, H. M. ; Crawford, T. ; Dobbs, M. ; Greer, C. H. ; Halverson, N. W. ; Holzapfel, W. L. ; Lanting, T. M. ; Lee, A. T. ; Leitch, E. M. ; Leong, J. ; Lu, W. ; Lueker, M. ; Mehl, J. ; Meyer, S. S. ; Mohr, J. J. ; Padin, S. ; Plagge, T. ; Pryke, C. ; Runyan, M. C. ; Schwan, D. ; Sharp, M. K. ; Spieler, H. ; Staniszewski, Z. ; Stark, A. A.
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Millimeter and submillimeter detectors for astronomy II : 23-25 June 2004, Glasgow, Scotland, United Kingdom. pp.11-29, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chen, P. P. ; Liu, G. J. ; Makino, H. ; Lu, W. ; Yao, T.
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Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.103-106, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.491-494, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.512-514, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.537-543, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Feng, Z.C. ; Yang, T. R. ; Karunasiri, R. P. G. ; Lu, W. ; Collins, W. E.(National Taiwan University)
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SiGe: materials, processing, and devices : proceedings of the First international symposium. pp.149-158, 2004. Pennington, N.J.. Electrochemical Society
Smart structures and materials 2004 : smart electronics, MEMS, BioMEMS, and nanotechnology : 15-18 March 2004, San Diego, California, USA. pp.399-410, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
El Naqa, I.M. ; Low, D.A. ; Christensen, G.E. ; Parikh, P.J. ; Song, J.H. ; Nystrom, M.M. ; Lu, W. ; Deasy, J.O. ; Hubenschmidt, J.P. ; Wahab, S.H. ; Mutic, S. ; Singh, A.K. ; Bradley, J.D.
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Medical Imaging 2004: Physiology, Function, and Structure from Medical Images. pp.100-106, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lu, W. ; Archie, C.N. ; Stone, S. ; Kang, H.H. ; Chitturi, P.R.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.503-514, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering