1.

Conference Proceedings
Conference Proceedings
1. Electrochemical and Salt Spray Corrosion Behavior of Copper Alloy Contact Wires in Chloride Solution
P.C. Zhang ; J. Zhang ; J.C. Jie ; Y. Gao ; Y. Dong
Pub. info.: Nano-Scale Materials, Materials Processing and Genomic Engineering : Selected, peer reviewed papers from the 12th IUMRS International Conference on Advanced Materials (IUMRS-ICAM 2013), September 22 -28, 2013, Qingdao, China.  pp.622-626,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 789
2.

Conference Proceedings
Conference Proceedings
2. Investigation of the Wear Behavior of High Strength and High Conductivity Cu-Cr-Zr Alloy under Dry Sliding
Y. Gao ; J.C. Jie ; P.C. Zhang ; J. Zhang ; T.M. Wang
Pub. info.: Basic Research of Materials : Selected, peer reviewed papers from the Chinese Materials Congress 2014 (CMC 2014), July 4-7, 2014, Chengdu, China.  pp.661-666,  2015.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 817
3.

Conference Proceedings
Conference Proceedings
3. Ambient light effect on the uniformity of image intensifier fluorescence screen brightness
Y. Qiu ; B. Chang ; L. Sun ; J. Zhang ; Y. Gao
Pub. info.: International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China.  pp.66210S-1-66210S-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6621
4.

Conference Proceedings
Conference Proceedings
4. Area source electron gun uniformity analysis
Y. Qiu ; B. Chang ; L. Sun ; J. Zhang ; Y. Gao
Pub. info.: International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China.  pp.66210H-1-66210H-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6621