Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.642017-1-642017-10, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63573M-1-63573M-5, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63573J-1-63573J-5, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63572Q-1-63572Q-6, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63574S-1-63574S-6, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hui Chen ; Balaji Raghothamachar ; William Vetter ; Michael Dudley ; Y. Wang ; B. J. Skromme
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Silicon carbide 2006--materials, processing and devices : symposium held April 18-20, 2006, San Francisco, California, U.S.A.. pp.169-174, 2006. Warrendale, Pa.. Materials Research Society
J.S. Hu ; H.M. Pen ; Y. Wang ; T. Chen ; Z. Chang ; X.L. Liu
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Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.369-372, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.93-96, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.65-68, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Proceedings of the 2005 Dragon Symposium : dragon programme mid-term results : 27 June-1 July 2005, Santorini, Greece. Book pp.379-386, 2006. Noordwijk, The Netherlands. ESA Publications Division
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.456-459, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
X.L. Liu ; H.M. Pen ; T. Chen ; F.G. Yan ; Y. Wang ; J.S. Hu
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Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.412-415, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.217-220, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63574B-1-63574B-5, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.635718-1-635718-5, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.64200Q-1-64200Q-7, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : GNSS and integrated geospatial applications : 28-29 October 2006, Wuhan, China. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.635715-1-635715-6, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.64200I-1-64200I-6, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.635706-1-635706-5, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63570G-1-63570G-7, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63570T-1-63570T-7, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.789-792, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.669-672, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.853-856, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.821-824, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.677-680, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Y. Wang ; F.G. Yan ; J.S. Hu ; T. Chen ; Z. Chang ; X.L. Liu
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Advances in materials manufacturing science and technology II : selected papers from the 12th International Manufacturing Conference in China, September 21-23, 2006, Xi'an, China. pp.845-848, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
R. Jia ; Y. Wang ; Z. Wang ; S. Tsai ; J. Dma ; D. Mao ; L. Karuppiah ; L. Chen
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Copper interconnects, new contact and barrier metallurgies/structures, and low-k interlevel dielectrics III : at the 208th ECS meeting, October 16-21, 2005, Los Angeles, California, USA. pp.125-134, 2006. Pennington, NJ. Electrochemical Society
C. Ni Chleirigh ; X. Wang ; G. Rimple ; Y. Wang ; M. Canonico ; D. D. Theodore ; O. Olubuyide ; J. L. Hoyt
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Advanced gate stack, source/drain and channel engineering for Si-based CMOS 2: new materials, processes, and equipment. pp.355-362, 2006. Pennington, NJ. Electrochemical Society
S. Guha ; V. Narayanan ; V. Paruchuri ; B. Linder ; M. Copel ; N. Bojarczuk ; Y. Kim ; M. Chudzik ; Y. Wang ; P. Ronsheim
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Advanced gate stack, source/drain and channel engineering for Si-based CMOS 2: new materials, processes, and equipment. pp.247-252, 2006. Pennington, NJ. Electrochemical Society
Haibo Zhao ; Jamelyn D. Holladay ; J.M. White ; Y. Wang ; Z.C. Zhang
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2006 AIChE annual meeting, November 12-17, 2006, San Francisco, California, San Francisco Hilton : conference proceedings. Topical conferences. 2006. New York. American Institute of Chemical Engineers