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19 results

Conference Proceedings

1. Advanced optical design for biochip scanning system

Huang,G. ; Cheng,J. ; Zhou,Y. ; Feng,J. ; Liu,C. ; Jin,G. ; Wu,M. ; Yan,Y. ; Yang,R. ; Li,L.

Pub. info.:	Current developments in lens design and optical systems engineering II : 30 July 2001, San Diego, USA. pp.171-178, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4441

Conference Proceedings

2. Novel optical devices for gene disease diagnostics system

Huang,G. ; Zhang,T. ; Cheng,J. ; Zhou,Y. ; Feng,J. ; Liu,C. ; Jin,G. ; Wu,M. ; Yan,Y. ; Yang,R.

Pub. info.:	Novel optical systems design and optimization IV : 1-2 August , 2001, San Diego, USA. pp.119-125, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4442

Conference Proceedings

3. Selection and attributes of objective function of electro-optical system vulnerbility to ECM(EOSVECM)

Zhang,J. ; Zhou,Y. ; An,W. ; Jiang,W. ; Lu,Q. ; Huang,H.

Pub. info.:	Data mining and applications : 23-24 October 2001, Wuhan, China. pp.110-115, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4556

Conference Proceedings

4. Principle of electro-optical system vulnerbility to ECM(EOSVECM)

Zhang,J. ; Zhou,Y. ; Zhu,L. ; Yang,Y. ; Wu,Y. ; Ye,X.

Pub. info.:	Data mining and applications : 23-24 October 2001, Wuhan, China. pp.172-177, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4556

Conference Proceedings

5. Radar signal compression using wavelet transforms

Zhou,Y. ; Li,F. ; Xu,Y. ; Qin,Q. ; Li,D.

Pub. info.:	Image compression and encryption technologies : 22-24 October 2001, Wuhan, China. pp.49-54, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4551

Conference Proceedings

6. Comparative properties of optically clear epoxy encapsulants

Edwards,M. ; Zhou,Y.

Pub. info.:	Wave-optical systems engineering : 30-31 July 2001 San Diego, USA. pp.190-197, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4436

Conference Proceedings

7. Color scene classification by Zernike moment invariants

Zhou,Y. ; Celenk,M.

Pub. info.:	Visual information processing X : 19-20 April 2001, Orlando, USA. pp.46-55, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4388

Conference Proceedings

8. Application research of the multifractal wavelet model in pattern recognition

Zhou,Y. ; Yang,J.

Pub. info.:	Image Matching and Analysis. pp.135-139, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4552

Conference Proceedings

9. New method for monitoring nitric oxide in vivo using microdialysis sampling and chemiluminescence reaction

Yao,D. ; Evmiridis,N.P. ; Zhou,Y. ; Xu,S. ; Zhou,H.

Pub. info.:	International Conference on Sensor Technology (ISTC 2001). pp.82-89, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4414

10.

Conference Proceedings

10. Chemiluminescence detection of peroxynitrite with flow injection

Dai,K. ; Evmiridis,N.P. ; Vlessidis,A. ; Zhou,Y.

Pub. info.:	International Conference on Sensor Technology (ISTC 2001). pp.104-107, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4414

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