1.

Conference Proceedings

Conference Proceedings
Y. Wang ; X. Zhao ; W. Chu
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
2.

Conference Proceedings

Conference Proceedings
Y. Wang ; C. Wu ; D. Shu ; X. Zhao ; X. Xin
Pub. info.: "Passive Components and Fiber-based.  1  pp.71341G-1-71341G-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7134
3.

Conference Proceedings

Conference Proceedings
J. Li ; Y. Wang ; X. Zhao ; F. Kong ; D. Zhang
Pub. info.: MEMS/MOEMS technologies and applications III : 12-14 November 2007, Beijing, China.  pp.68360F-1-68360F-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6836
4.

Conference Proceedings

Conference Proceedings
L. Shi ; Y. Wang ; D. Wu ; X. Zhao
Pub. info.: Second international conference on space information technology : 10-11 November 2007, Wuhan, China.  2  pp.67953N-1-67953N-7,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6795