C. Ni Chleirigh ; X. Wang ; G. Rimple ; Y. Wang ; M. Canonico ; D. D. Theodore ; O. Olubuyide ; J. L. Hoyt
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS 2: new materials, processes, and equipment. pp.355-362, 2006. Pennington, NJ. Electrochemical Society
Network architectures, management, and applications V. 1 pp.67840Y-1-67840Y-9, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Measurement theory and systems and aeronautical equipment : Seventh International Symposium on Instrumentation and Control Technology, 10-13 October 2008, Beijing, China. pp.712823-1-712823-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Measurement theory and systems and aeronautical equipment : Seventh International Symposium on Instrumentation and Control Technology, 10-13 October 2008, Beijing, China. pp.712824-1-712824-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2008 and Joint Conference on GIS and Built Environment : classification of remote sensing images : 28-29 June 2008, Guangzhou, China. pp.71470N-1-71470N-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Second international conference on space information technology : 10-11 November 2007, Wuhan, China. 2 pp.679559-1-679559-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Design, manufacturing, and testing of micro- and nano-optical devices and systems : 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 19-21 November 2008, Chengdu, China. pp.728402-1-728402-4, 2009. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering