1.

Conference Proceedings
Conference Proceedings
1. Probing Nanoscale Local Lattice Strains in Advanced Si CMOS Devices by CBED: A Tutorial with Recent Results
M. Kim ; J. Huang ; P. Chidambaram ; R. Irwin ; P. Jones ; J. Weijtmans ; E. Koontz ; Y. Wang ; S. Tang ; R. Wise
Pub. info.: Silicon materials science and technology X.  pp.541-548,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(2)
2.

Conference Proceedings
Conference Proceedings
2. Audio watermarking robust to geometrical distortions based on dyadic wavelet transform
Y. Wang ; S. Wu ; J. Huang
Pub. info.: Security, steganography, and watermarking of multimedia contents IX : 29 January-1 February 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6505
3.

Conference Proceedings
Conference Proceedings
3. Sub-nanometer pitch calibration and data quality evaluation methodology
C.-M. Ke ; Y. Wang ; J. Huang ; J. Hu
Pub. info.: Metrology, inspection, and process control for microlithography XXII.  1  pp.69220I-1-69220I-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6922