Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63573J-1-63573J-5, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63570T-1-63570T-7, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Measurement theory and systems and aeronautical equipment : Seventh International Symposium on Instrumentation and Control Technology, 10-13 October 2008, Beijing, China. pp.712812-1-712812-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Biometric technology for human identification V : 18-19 March 2008, Orlando, Florida, USA. pp.69440Q-1-69440Q-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor lasers and applications III : 12-13 November 2007, Beijing, China. pp.68241L-1-68241L-10, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China. pp.69840P-1-69840P-5, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering