1.

Conference Proceedings
Conference Proceedings
1. Land degradation analysis based on the land use changes and land degradation evaluation in the Huan Beijing area [5983-47]
Guo, X. ; Wang, J. ; Xie, J. ; He, T. ; Lian, G. ; Lv, C.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium.  pp.598319-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5983
2.

Conference Proceedings
Conference Proceedings
2. Land degradation drive forces and trends in the NW region of Beijing [5983-42]
Wang, J. ; He, T. ; Guo, X. ; Lv, C.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium.  pp.598315-598315,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5983
3.

Conference Proceedings
Conference Proceedings
3. Extraction of canopy closures and stem diversities in winter wheat
Huang, W. ; Wang, J. ; Liu, L. ; Zhao, C. ; Guo, X. ; Wang, J.
Pub. info.: Multispectral and hyperspectral remote sensing instruments and applications II : 9-11 November 2004, Honolulu, Hawaii, USA.  pp.398-406,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5655
4.

Conference Proceedings
Conference Proceedings
4. Study on applying hyperspectral remote sensing technology in land quality monitoring
He, T. ; Wang, J. ; Guo, X. ; Chen, Y.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology IV : 14-16 September 2004, Maspalomas, Gran Canaria, Spain.  pp.410-419,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5574