Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA. pp.262-273, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA. pp.252-261, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chemical and biological standoff detection III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.599502-599502, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wu, L. ; Wang, J. ; Ramakrishna, B. ; Hsueh, M. ; Liu, J. ; Wu, Q ; Wu, C.-C. ; Cao, M. ; Chang, C.-I. ; Jensen, J. L. ; Jensen, J. O. ; Knapp, H. ; Daniel, R. ; Yin, R.
Pub. info.:
Chemical and biological standoff detection III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.59950B-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yang, S. ; Wang, J. ; Chang, C.-I. ; Jensen, J.L. ; Jensen, J.O.
Pub. info.:
Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA. pp.354-365, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering