1.

Conference Proceedings

Conference Proceedings
Wang, J. ; Chang, C.-I. ; Cao, M.
Pub. info.: Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA.  pp.262-273,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5268
2.

Conference Proceedings

Conference Proceedings
Chang, C.-I. ; Wang, J. ; D'Amico, F.M. ; Jensen, J.O.
Pub. info.: Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA.  pp.252-261,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5268
3.

Conference Proceedings

Conference Proceedings
Wang, J. ; Chang, C.-I.
Pub. info.: Chemical and biological standoff detection III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.599502-599502,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5995
4.

Conference Proceedings

Conference Proceedings
Wu, L. ; Wang, J. ; Ramakrishna, B. ; Hsueh, M. ; Liu, J. ; Wu, Q ; Wu, C.-C. ; Cao, M. ; Chang, C.-I. ; Jensen, J. L. ; Jensen, J. O. ; Knapp, H. ; Daniel, R. ; Yin, R.
Pub. info.: Chemical and biological standoff detection III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.59950B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5995
5.

Conference Proceedings

Conference Proceedings
Yang, S. ; Wang, J. ; Chang, C.-I. ; Jensen, J.L. ; Jensen, J.O.
Pub. info.: Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA.  pp.354-365,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5546