1.

Conference Proceedings
Conference Proceedings
1. Physical MOS models
Schroen H. W.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.689-704,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
2.

Conference Proceedings
Conference Proceedings
2. Modeling of I2L and process selection
Schroen H. W.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.813-836,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
3.

Conference Proceedings
Conference Proceedings
3. Process modeling
Schroen H. W.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.767-794,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
4.

Conference Proceedings
Conference Proceedings
4. Test structures and diagnostic techniques
Schroen H. W.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.173-212,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21