1.

Conference Proceedings
Conference Proceedings
1. Ion implanted MOS transistors
Merckel G.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.677-688,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
2.

Conference Proceedings
Conference Proceedings
2. SOS MOSFET's
Merckel G.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.725-738,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
3.

Conference Proceedings
Conference Proceedings
3. Short channels. Scaled down MOSFET's
Merckel G.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.705-724,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
4.

Conference Proceedings
Conference Proceedings
4. CAD models of MOSFET's
Merckel G.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.751-764,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
5.

Conference Proceedings
Conference Proceedings
5. Surface characterization. Weak inversion
Merckel G.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.609-615,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
6.

Conference Proceedings
Conference Proceedings
6. Surface characterization. C-V technique
Merckel G. ; de Pontcharra J.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.589-608,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21