1.

Conference Proceedings
Conference Proceedings
1. Characterization and measuremehts of MOST devices
Klaassen M. F.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.573-588,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
2.

Conference Proceedings
Conference Proceedings
2. A MOST model for CAD with automated parameter determination
Klaassen M. F.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.739-750,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
3.

Conference Proceedings
Conference Proceedings
3. Review of physical models for MOS transistors
Klaassen M. F.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.541-571,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21
4.

Conference Proceedings
Conference Proceedings
4. Survey of I2L modeling
Klaassen M. F.
Pub. info.: Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977].  pp.519-537,  1977.  Leyden.  Noordhoff International Publishing
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 21