Innovative telescopes and instrumentation for solar astrophysics : 24-28 August 2002, Waikoloa, Hawaii, USA. pp.640-647, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Innovative telescopes and instrumentation for solar astrophysics : 24-28 August 2002, Waikoloa, Hawaii, USA. pp.667-674, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced process control and automation : 27 February, 2003, Santa Clara, California, USA. pp.109-120, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2003 : Active materials : Behavior and mechanics : 3-6 March 2003, San Diego, California, USA. pp.335-346, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Innovative telescopes and instrumentation for solar astrophysics : 24-28 August 2002, Waikoloa, Hawaii, USA. pp.542-550, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced signal processing algorithms, architectures, and implementations XIII : 6-8 August, 2003, San Diego, California, USA. pp.399-410, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA. pp.106-114, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fox, G. E. ; Hury, J. ; Nagaswamy, U. ; Wang, J. ; Naik, A. K.
Pub. info.:
Instruments, methods, and missions for astrobiology V : 22-23 August 2002, Waikoloa, Hawaii, USA. pp.145-153, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral remote sensing instruments and applicaionts :25-27 October 2002, Hangzhou, China. pp.187-193, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral remote sensing instruments and applicaionts :25-27 October 2002, Hangzhou, China. pp.151-159, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced signal processing algorithms, architectures, and implementations XIII : 6-8 August, 2003, San Diego, California, USA. pp.266-273, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, J. ; Dehring, M. ; Nardell, C.A. ; Dykeman, D.A. ; Moocre, B., III
Pub. info.:
Lidar remote sensing for environmental monitoring IV : 3-4 August 2003, San Diego, California, USA. pp.93-104, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Symposium on Laser Precision Microfabrication : 21-24 June, 2003, Munich, Germany. pp.329-332, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chang, K. ; Shanmugasundaram, K. ; Lee, D.-O. ; Roman, P. ; Shallenberger, J. ; Chang, F.-M. ; Wang, J. ; Beck, R. ; Mumbauer, P. ; Grant, R. ; Ruzyllo, J.
Pub. info.:
Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium. pp.78-85, 2003. Pennington, NJ. Electrochemical Society
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA. pp.71-79, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, J. ; Watanabe, M. ; Goto, Y. ; Fujii, K. ; Kuriaki, H. ; Satoh, M. ; Ikeda, J. ; Fujimoto, K.
Pub. info.:
First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan. pp.26-31, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jin, S. ; Zhou, W. ; Zhang, Z. ; Liu, T. ; Xu, J. ; Wang, J. ; Liu, H.
Pub. info.:
Fundamental problems of optoelectronics and microelectronics : 30 September-4 october, 2002, Vladivostok, Russia. pp.202-207, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhang, Z. ; Jin, S. ; Liu, H. ; Kim, I.S. ; Wang, J. ; Wu, X. ; Guo, N. ; Liu, T. ; Yu, X.
Pub. info.:
Fundamental problems of optoelectronics and microelectronics : 30 September-4 october, 2002, Vladivostok, Russia. pp.208-214, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.274-277, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.264-269, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Acquisition, tracking, and pointing XVII : 22 April 2003, Oriando, Florida, USA. pp.114-122, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yu, Z. ; Liang, Y. ; Li, H. ; Curless, J. ; Overgaard, C. ; Droopad, R. ; Wei, Y. ; Hu, X. ; Craigo, B. ; Finder, J. ; Eisenbeiser, K. ; Talin, A. ; Smith, S. ; Voight, S. ; Wang, J. ; Marshall, D. ; Jordan, D. ; Edwards, J. Jr. ; Moore, K.
Pub. info.:
Crystalline oxide-silicon heterostructures and oxide optoelectronics : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A.. pp.31-42, 2003. Warrendale, PA. Materials Research Society
Gao, F. ; Li, X. ; Armstrong, R. L. ; Wang, J. ; Che, T. ; Xu, W.
Pub. info.:
Microwave remote sensing of the atmosphere and environment III : 24-25 October 2002, Hangzhou, China. pp.456-463, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Microwave remote sensing of the atmosphere and environment III : 24-25 October 2002, Hangzhou, China. pp.446-455, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Denket, C.J. ; Ma, J. ; Wang, J. ; Didkovsky, L.V. ; Varsik, J.R. ; Wang, H. ; Goode, P.R.
Pub. info.:
Innovative telescopes and instrumentation for solar astrophysics : 24-28 August 2002, Waikoloa, Hawaii, USA. pp.223-234, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.784-787, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gradient index, miniature, and diffractive optical systems III : 6-7 August 2003, San Diego, California, USA. pp.146-154, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zheng, L. ; Wang, J. ; Kong, X. ; Chen, D. ; Liu, Z. ; Qian, J. ; Li, Y.
Pub. info.:
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.366-371, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
An, L. ; Wang, J. ; Liu, Y. ; Chen, T. ; Xu, S. ; Feng, H. ; Wang, X.
Pub. info.:
Ultravaiolet ground-and space-based measurements, models, and effects II :25 October 2002, Hangzhou, China. pp.223-231, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.6-10, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.52-56, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Document recognition and retrieval X : 22-24 January 2003, Santa Clara, California, USA. pp.156-163, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China. pp.49-56, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, J. ; Hock, T. F. ; Lauritsen, D. ; Cole, H. L. ; Beierle, K. ; Chamberlain, N. ; Parsons, D. B. ; Carlson, D. J.
Pub. info.:
Atmospheric and oceanic processes, dynamics, and climate change : 25 and 27 October 2002, Hangzhou, China. pp.132-143, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.681-685, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yu, G. ; Srdanov, G. ; Zhang, B. ; Stevenson, M. ; Wang, J. ; Chen, P. ; Baggao, E. ; Macias, J. ; Sun, R. ; McPherson, C. ; Sant, P. ; Innocenzo, J. ; Stainer, M. ; O'Regan, M.B.
Pub. info.:
Cockpit displays X : 22-25 April 2003, Oriando, Florida, USA. pp.192-199, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhu, H. -O. ; Wang, J. ; Zeng, C. -Y. ; Zhao, D. -Y.
Pub. info.:
Nanotechnology in mesostructured materials : proceedings of the 3rd International Mesostructured Materials Symposium, Jeju, Korea, July 8-11, 2002. pp.661-664, 2003. Amsterdam. Elsevier
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.577-580, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain. pp.2479-2484, 2003. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Functionally graded materials VII : proceedings of the seventh International Symposium on Functionally Graded Materials (FGM 2002), Beijing, China, October 15-18, 2002. pp.515-518, 2003. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Functionally graded materials VII : proceedings of the seventh International Symposium on Functionally Graded Materials (FGM 2002), Beijing, China, October 15-18, 2002. pp.501-504, 2003. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Functionally graded materials VII : proceedings of the seventh International Symposium on Functionally Graded Materials (FGM 2002), Beijing, China, October 15-18, 2002. pp.491-494, 2003. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Functionally graded materials VII : proceedings of the seventh International Symposium on Functionally Graded Materials (FGM 2002), Beijing, China, October 15-18, 2002. pp.485-490, 2003. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Functionally graded materials VII : proceedings of the seventh International Symposium on Functionally Graded Materials (FGM 2002), Beijing, China, October 15-18, 2002. pp.461-466, 2003. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA. pp.134-141, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Liu, J. ; MacPhee, A.G. ; Liu, C. ; Shan, B. ; Chang, Z. ; Wang, J.
Pub. info.:
Low-light-level and real-time imaging systems, components, and applications :9-11 July 2002, Seattle, Washington, USA. pp.184-188, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhou, W. ; Zhao, Y. ; Yang, Z. ; Wang, J. ; Jia, P.
Pub. info.:
Third International conference on virtual reality and its application in industry : 9-12 April 2002, Hangzhou, China. pp.23-30, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing for environmental monitoring, GIS applications, and geology II :23-26 September 2002, Agia Pelagia, Crete, Greece. pp.279-288, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land. Part Two pp.838-843, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering