1.

Conference Proceedings
Conference Proceedings
1. Design of a real-time video processing system with FPGA
Liu, W. ; Chi, Z.Y. ; Chen, W.J.
Pub. info.: Electronic imaging and multimedia technology III : 15-17 October, 2002, Shanghai, China.  pp.467-469,  2002.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4925
2.

Conference Proceedings
Conference Proceedings
2. New type of compact optical correlator with noise resistance
Hao, Y. ; Liu, W. ; Lu, S. ; Wang, J. ; Zhang, Y.
Pub. info.: Optical pattern recognition XIII : 2 April, 2002, Orlando, USA.  pp.185-193,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4734
3.

Conference Proceedings
Conference Proceedings
3. Identify The Plane Modal by Acoustic Response
Ying, H. ; Liu, W. ; Liu, C.
Pub. info.: Proceedings of IMAC-XX : a Conference on Structural Dynamics, February 4-7, 2002, The Westin Los Angeles Airport, Los Angeles, California.  Volume I  pp.779-782,  2002.  Bethel, CT.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4753
4.

Conference Proceedings
Conference Proceedings
4. Welding-induced alignment distortion in DIP LD packges: effect of laser weding sequence
Liu, W. ; Lin, Y. ; Shi, F.G.
Pub. info.: Optoelectronic Interconnects, Integrated Circuits, and Packaging.  pp.128-135,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4652
5.

Conference Proceedings
Conference Proceedings
5. Line-profile and critical-dimension correlation between a normal-incidence optical CD metrology system and SEM
Yang, W. ; Lowe-Webb, R. ; Korlahalli, R. ; Zhuang, V.G. ; Sasano, H. ; Liu, W. ; Mui, D.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part Two  pp.966-976,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689