Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.635722-1-635722-6, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Network Architectures, Management, and Applications VI. 1 pp.71371B-1-71371B-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Network Architectures, Management, and Applications VI. 1 pp.71370J-1-71370J-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Network architectures, management, and applications V. 1 pp.67840R-1-67840R-11, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Network architectures, management, and applications V. 1 pp.67841L-1-67841L-12, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Network architectures, management, and applications V. 2 pp.67842D-1-67842D-9, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
L.-J. Zhao ; J. Zhang ; L. Wang ; Y.-B. Cheng ; J.-Q. Pan
Pub. info.:
Semiconductor lasers and applications III : 12-13 November 2007, Beijing, China. pp.68240N-1-68240N-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering