Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA. pp.351-358, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Unmanned ground vehicle technology IV: 2-3 April 2001, Orlando, USA. pp.275-286, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Yeh, N.-C. ; Chen, C.-T. ; Vasquez, R.P. ; Jung, C.U. ; Kim, J.Y. ; Park, M.S. ; Kim, H.J. ; Lee, S.-I. ; Yoshida, K. ; Tajima, S.
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Superconducting and related oxides : physics and nanoengineering V : 8-11 July, 2002, Seattle, Washington, USA. pp.182-194, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nakashima, Y. ; Kamimuki, K. ; Nakabayashi, T. ; Yoshida, K.
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First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan. pp.160-164, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of artificial neural networks in image processing VIII : 23-24 January 2003, Santa Clara, California, USA. pp.47-54, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Umezu, I. ; Yoshida, K. ; Inada, M. ; Sugimura, A.
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Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, PA.. Materials Research Society
Yoshida, K. ; Shimizu, A. ; Fomin, S. ; Hashida, T.
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Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 10-16 June, 2002, St. Petersburg, Russia. pp.207-215, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nakashima, K. ; Eryu, O. ; Ukai, S. ; Yoshida, K. ; Watanabe, M.
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Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.1005-1008, 2000. Zuerich, Switzerland. Trans Tech Publications
Aluminium alloys 2002 : their physical and mechanical properties : proceedings of the 8th International Conference ICAA8, Cambridge, UK, 2-5 July 2002. pp.1405-1410, 2002. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Murahara, M.M. ; Ogawa, Y. ; Yoshida, K. ; Okamoto, Y.
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Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.48-54, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering