1.

Conference Proceedings

Conference Proceedings
Sato, M. ; Tanaka, R. ; Yoshida, K.
Pub. info.: Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA.  pp.351-358,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5415
2.

Conference Proceedings

Conference Proceedings
Yoshida, K. ; Hamano, H.
Pub. info.: Unmanned ground vehicle technology IV: 2-3 April 2001, Orlando, USA.  pp.275-286,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4715
3.

Conference Proceedings

Conference Proceedings
Yeh, N.-C. ; Chen, C.-T. ; Vasquez, R.P. ; Jung, C.U. ; Kim, J.Y. ; Park, M.S. ; Kim, H.J. ; Lee, S.-I. ; Yoshida, K. ; Tajima, S.
Pub. info.: Superconducting and related oxides : physics and nanoengineering V : 8-11 July, 2002, Seattle, Washington, USA.  pp.182-194,  2002.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4811
4.

Conference Proceedings

Conference Proceedings
Nakashima, Y. ; Kamimuki, K. ; Nakabayashi, T. ; Yoshida, K.
Pub. info.: First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan.  pp.160-164,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4831
5.

Conference Proceedings

Conference Proceedings
Hild, M. ; Yoshida, K. ; Hashimoto, M.
Pub. info.: Applications of artificial neural networks in image processing VIII : 23-24 January 2003, Santa Clara, California, USA.  pp.47-54,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5015
6.

Conference Proceedings

Conference Proceedings
Umezu, I. ; Yoshida, K. ; Inada, M. ; Sugimura, A.
Pub. info.: Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 638
7.

Conference Proceedings

Conference Proceedings
Yoshida, K. ; Shimizu, A. ; Fomin, S. ; Hashida, T.
Pub. info.: Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 10-16 June, 2002, St. Petersburg, Russia.  pp.207-215,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5127
8.

Conference Proceedings

Conference Proceedings
Nakashima, K. ; Eryu, O. ; Ukai, S. ; Yoshida, K. ; Watanabe, M.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1005-1008,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
9.

Conference Proceedings

Conference Proceedings
Horikawa, K. ; Yoshida, K. ; Sakamaki, K.
Pub. info.: Aluminium alloys 2002 : their physical and mechanical properties : proceedings of the 8th International Conference ICAA8, Cambridge, UK, 2-5 July 2002.  pp.1405-1410,  2002.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 396-402
10.

Conference Proceedings

Conference Proceedings
Murahara, M.M. ; Ogawa, Y. ; Yoshida, K. ; Okamoto, Y.
Pub. info.: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.48-54,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4932