1.

Conference Proceedings
Conference Proceedings
1. AlInAs Band Gap Modulations Observed by TEM and Optical Measurements
Bearzi, E. ; Benyattou, T. ; Bru-Chevallier, C. ; Guillot, G. ; Harmand, J. C. ; Marty, O. ; Pitaval, M.
Pub. info.: Optoelectronic materials : ordering, composition modulation, and self-assembled structures : symposium held November 28-30, 1995, Boston, Massachusetts, U.S. ..  pp.271-,  1996.  Pittsburgh, Pennsylvania..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 417
2.

Conference Proceedings
Conference Proceedings
2. Photoluminescence Characteristics of GaN Layers Grown on SOI Substrates and Relation to Material Properties
Phillippe, A. ; Bru-Chevallier, C. ; Guillot, G. ; Cao, J. ; Pavlidis, D. ; Eisenbach, A.
Pub. info.: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.307-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 482
3.

Conference Proceedings
Conference Proceedings
3. Effect of Heavy Doping on the Photoluminescence and Photoreflectance Spectra of Silicon and SiGe Layers
Bru-Chevallier, C. ; Trui, B. ; Souifi, A. ; Bremond, G. ; Guillot, G. ; Chroboczek, J. A.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.295-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
4.

Conference Proceedings
Conference Proceedings
4. Steplike Lineshape of Low Temperature Photoreflectance Spectra of InAlAs
Baltagi, Y. ; Bearzi, E. ; Bru-Chevallier, C. ; Benyattou, T. ; Guillot, G. ; Harmand, J. C.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.333-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406