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59 results

Conference Proceedings

1. High-aspect-ratio microstructure fabrication using SU-8 resist

Zhu,J. ; Zhao,X. ; Ni,Z.

Pub. info.:	Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA. pp.86-89, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4174

Conference Proceedings

2. Exponential decomposition using displacement structure

Qiao,S. ; Zhu,J.

Pub. info.:	Advanced signal processing algorithms, architectures, and implementations XI : 1-3 August, 2001, San Diego, [Calif.] USA. pp.246-253, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4474

Conference Proceedings

3. Orthogonal method for processing of SU-8 resist in UV-LIGA

Liu,J. ; Zhu,J. ; Ding,G. ; Zhao,X. ; Cai,B.

Pub. info.:	Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA. pp.462-466, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4557

Conference Proceedings

4. The Study of Ni-Ti Shape Memory Alloys by Positron Annihilation Technique and DSC

Zhu,J. ; Yu,R.H. ; Deng,W. ; Xiong,L.Y. ; Li,Y.S.

Pub. info.:	Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary. Pt.2 pp.1345-1348, 1992. Aederlmannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	105-110

Conference Proceedings

5. Approach to pattern aspect ratio control

Thomas,A.C. ; Zach,F.X. ; Wong,A.K. ; Ferguson,R.A. ; Samuels,D.J. ; Longo,R. ; Zhu,J. ; Feild,C.

Pub. info.:	Optical microlithography XII : 17-19 March 1999, Santa Clara, California. Part2 pp.839-846, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3679

Conference Proceedings

6. Design of a projection display screen with vanishing color shift for rear-projection HDTV

Liu,X. ; Zhu,J.

Pub. info.:	Display devices and systems : 6-7 November 1996, Beijing, China. pp.190-194, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2892

Conference Proceedings

7. Computation of depth distribution of the optical absorption coefficient in a multilayer inhomogenous material

Zhu,J. ; Dong,M.

Pub. info.:	Smart materials, structures, and integrated systems : 11-13 December 1997, Adelaide, Australia. pp.417-428, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3241

Conference Proceedings

8. Two kinds of new beam lasers

Wnag,S. ; Zhu,J. ; Lu,X. ; Lin,Q. ; Zhao,D.

Pub. info.:	Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China. pp.516-520, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3550

Conference Proceedings

9. Time-resolved transfer characteristics of ultrafast pulse in linear system

Zhu,J. ; Yang,G. ; Zhang,J. ; Feng,J. ; Yin,Y. ; Jin,B. ; Weng,Z.

Pub. info.:	Lasers in medicine and dentistry : diagnostics and treatment : 4-5 November 1996, Beijing, China. pp.169-179, 1996. Bellingham, Wash.,. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2887

10.

Conference Proceedings

10. New inverse computation for optical-absorption coefficient in semiconductor material

Zhu,J.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.269-273, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

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