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11 results

Conference Proceedings

1. Fiber optic transversal filter design based on spectral tapping of broadband light using fiber gratings

Yi, X. ; Wei, F. ; Hong, N.J. ; Chao, L. ; Zhong, W.

Pub. info.:	APOC 2001: Asia-Pacific Optical and Wireless Communications : Optical fiber and planar waveguide technology : 13-15 November 2001, Beijing, Chaina. pp.162-169, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4579

Conference Proceedings

2. Length Effects On The Reliability Of Dual-Damascene Cu Interconnects

Wei, F. ; Gan, C.L. ; Thompson, C.V. ; Clement, J.J. ; Hau-Riege, S.P. ; Pey, K.L. ; Choi, W.K. ; Tay, H.L. ; Yu, B. ; Radhakrishnan, M.K.

Pub. info.:	Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.645-650, 2002. Warrendale. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	716

Conference Proceedings

3. Effect of Inhomogeneity of Carbide Precipitation on Nanohardness Distribution for Martensitic Steels

Li, J. ; Ohmura, T. ; Wei, F. ; Tsuzaki, K.

Pub. info.:	PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.4109-4112, 2005. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	475-479(5)

Conference Proceedings

4. Experimental Characterization Of The Reliability Of 3-Terminal Dual-Damascene Copper Interconnect Trees

Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K. ; Wei, F. ; Yu, B. ; Hau-Riege, S.P.

Pub. info.:	Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.431-438, 2002. Warrendale. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	716

Conference Proceedings

5. Fatal Void Size Comparisons in Via-Below and Via-Above Cu Dual-Damascene Interconnects

Choi, Z.-S. ; Gan, C.L. ; Wei, F. ; Thompson, C.V. ; Lee, J.H. ; Pey, K.L. ; Choi, W.K.

Pub. info.:	Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.373-378, 2004. Warrendale. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	812

Technical Paper

6. Optimization of an Intermeshing Rotor Transmission System Design

Saribay, Z. ; Wei, F. ; Sahay, C.

Pub. info.:	AIAA meeting papers on disc. 2005. [Reston, Va.]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:	46th

Technical Paper

7. Iteration Method for Eigenvector Derivatives Calculation with Repeated Roots

Wei, F. ; Zhang, D.

Pub. info.:	AIAA meeting papers on disc. 2005. [Reston, Va.]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:	46th

Technical Paper

8. Integration Design and Performance Analysis of HAT Cycle Incorporated with Absorption Heat Pump.

Wei, F. ; Xiao, Y. ; Zhang, S.

Pub. info.:	A.S.M.E. paper. 2007. New York, NY. American Society of Mechanical Engineers
Title of ser.:	ASME Technical Paper : GT
Ser. no.:	2007

Technical Paper

9. Latent Heat Recovery and Performance Studies for an Open Cycle Absorption Heat Transformer.

Wei, F. ; Xiao, Y. ; Zhang, S.

Pub. info.:	A.S.M.E. paper. 2008. New York, NY. American Society of Mechanical Engineers
Title of ser.:	ASME Technical Paper : GT
Ser. no.:	2008

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Conference Proceedings

10. Survey and alignment of ELETTRA storage ring

Talarico, C. ; Semeraro, L. ; Lo Bue, A. ; Gambitta, A. ; Turchet, A. ; Wei, F. ; Cassani, C.

Pub. info.:	Optical Measurement Systems for Industrial Inspection III. pp.831-839, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5144

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