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Conference Proceedings

1. Optical properties of ion-implanted laser-annealed Si studied by spectroscopic ellipsometry

Asai,K. ; Watanabe,K. ; Sameshima,T. ; Saitoh,T. ; Xiong,Y.-M.

Pub. info.:	International Symposium on Polarization Analysis and Applications to Device Technology. pp.258-261, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2873

Conference Proceedings

2. Investigation of anisotropic effect on the optical properties of InxGa1-xP using spectroscopic ellipsometry

Watanabe,K. ; Saitoh,T. ; Xiong,Y.-M.

Pub. info.:	International Symposium on Polarization Analysis and Applications to Device Technology. pp.266-269, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2873