1.

Conference Proceedings
Conference Proceedings
1. SOI Wafer Fabrication by Atomic Layer Cleaving
Current, M.I. ; Malik, I.J. ; Bedell, SW. ; Farrens, S.N. ; Kirk, H. ; Korolik, M. ; Kang, S. ; Fuerfanger, M. ; Henley, F.J.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.516-523,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. STRUCTURE AND MORPHOLOGY OF 'D-DEFECTS' IN CZ Si
Park, J-G. ; Kirk, H. ; Cho, K-C. ; Lee, H-K. ; Lee, C-S. ; Rozgonyi, G.A.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.370-378,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
3.

Conference Proceedings
Conference Proceedings
3. Atomic-Layer Cleaving for SOI Wafer Fabrication and a Path Towards Laminated Electronics
Current, M.I. ; Malik, I.J. ; Bedell, S.W. ; Kirk, H. ; Korolik, M. ; Kang, S. ; Henley, F.J.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.75-78,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
4.

Conference Proceedings
Conference Proceedings
4. Electrical Characterization of Bonded SOI with Hg-contact “Horseshoe” Probes and InGa-contact “H-FET” Structures
Kirk, H. ; Bedell, S. ; Current, M.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.103-108,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
5.

Conference Proceedings
Conference Proceedings
5. (7.4) 3:20 - 3:50 PM - Optoelectronic Substrates by SiGen NanoTecTM-A General Layer-Transfer (LT) Approach (Invited)
Malik, I. J. ; Lamm, A. J. ; Sullivan, J. ; Kang, S. ; Jacy, D. ; Kirk, H. ; Ong, P. J. ; Henley, F. J. (Silicon Genesis)
Pub. info.: SiGe: materials, processing, and devices : proceedings of the First international symposium.  pp.543-554,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-07
6.

Conference Proceedings
Conference Proceedings
6. Correlat ion of Substrate D-Defects in CZ Silicon with MOS Breakdown
Park, J-G. ; Kirk, H. ; Lee, C-S. ; Lee, H-K. ; Lee, D-M. ; Rozgonyi, G.A.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.57-71,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1