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12 results

Conference Proceedings

1. Modeling and dynamic behavior of rotating blades carrying a tip mass and incorporating adaptive capabilities

Song,O. ; Librescu,L. ; Kim,H.-B.

Pub. info.:	Smart structures and materials 1997 : Mathematics and control in smart structures : 3-6 March 1997, San Diego, California. pp.488-497, 1997. Bellingham. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3039

Conference Proceedings

2. Novel approximate model for resist process

Ahn,C.-N. ; Kim,H.-B. ; Baik,K.-H.

Pub. info.:	Optical microlithography XI : 25-27 February 1998, Santa Clara, California. pp.752-763, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3334

Conference Proceedings

3. Accuracy of diffused aerial image model for full-chip-level optical proximity correction

Hong,J.-S. ; Kim,H.-B. ; Yune,H.-S. ; Ahn,C.-N. ; Koo,Y.-M. ; Baik,K.-H.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part2 pp.1024-1032, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

4. Validation of repair process for DUV attenuated phase-shift mask

Paek,S.W. ; Kim,H.-B. ; Ahn,C.-N. ; Koo,Y.-M. ; Baik,K.-H.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part1 pp.612-620, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

5. Exposure latitude analysis for dense line and space patterns by using diffused aerial image model

Ahn,C.-N. ; Kim,H.-B. ; Baik,K.-H.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part1 pp.665-675, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

6. Moving information extraction for moving-object tracking

Kim,H.-B. ; Chang,M.-H. ; Kang,S.-K. ; Chun,J.-H. ; Park,J.-A.

Pub. info.:	Internet multimedia management systems : 6-7 November 2000, Boston, USA. pp.195-203, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4210

Technical Paper

7. Mixing and Combustion Augmentations of Transverse Injection in SCRamjet Combustor

Lee,S.-H. ; Kim,H.-B. ; Mitani,T.

Pub. info.:	AIAA paper. pp.1-11, 2001. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:	2001

Conference Proceedings

8. Characteristic extraction of face using DWT and recognition based on neural networks

Kim,H.-B. ; Lim,C.-H. ; Park,S.-J. ; Park,J.-A.

Pub. info.:	Input/Output and Imaging Technolgies II. pp.180-191, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4080

Conference Proceedings

9. Mask critical dimension error on optical lithography

Eom,T.-S. ; Koo,S.-S. ; Paek,S.-W. ; Kim,H.-B. ; Ahn,C.-N. ; Baik,K.-H.

Pub. info.:	Photomask and Next-Generation Lithography Mask Technology VII. pp.32-39, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4066

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Conference Proceedings

10. Application of full-chip level optical proximity correction to memory device with sub-0.10-μm design rule and ArF lithography

Yune,H.-S. ; Kim,H.-B. ; Kim,W.-H. ; Ahn,C.-N. ; Ham,Y.-M. ; Shin,K.-S.

Pub. info.:	Optical Microlithography XIV. 4346 pp.241-250, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4346

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