1.

Conference Proceedings

Conference Proceedings
Zhou, H. ; Hughlett, C. ; Hanan, J.C. ; Chao, T.-H.
Pub. info.: Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA.  pp.87-94,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5437
2.

Conference Proceedings

Conference Proceedings
Hanan, J.C. ; Chao, T.-H. ; Moreels, P.
Pub. info.: Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA.  pp.233-237,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5437
3.

Conference Proceedings

Conference Proceedings
Hanan, J.C. ; Chao, T.-H. ; Reyes, G.F.
Pub. info.: Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA.  pp.109-114,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5437
4.

Conference Proceedings

Conference Proceedings
Hanan, J.C. ; Ustundag, E. ; Clausen, B. ; Sivasambu, M. ; Beyerlein, I.J. ; Brown, D.W. ; Bourke, M.A.M.
Pub. info.: ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002.  pp.907-912,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 404-407
5.

Conference Proceedings

Conference Proceedings
Hanan, J.C. ; Aydiner, C.C. ; Ustundag, E. ; Swift, G.A. ; Kaldor, S.K. ; Cevdet Noyan, I.
Pub. info.: ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002.  pp.919-924,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 404-407
6.

Conference Proceedings

Conference Proceedings
Hanan, J.C. ; Clausen, B. ; Swift, G.A. ; Ustundag, E. ; Beyerlein, I.J. ; Almer, Jonathan D. ; Lienert, U. ; Haeffner, D.R.
Pub. info.: ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002.  pp.913-918,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 404-407
7.

Conference Proceedings

Conference Proceedings
Chao, T.-H. ; Hanan, J.C. ; Zhou, H. ; Reyes, G.F.
Pub. info.: Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA.  pp.13-16,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5437
8.

Technical Paper

Technical Paper
Hanan, J.C. ; Beyerlein, I.J. ; Almer, J.D.
Pub. info.: SME technical paper.  2004.  Society of Manufacturing Engineers