Zhou, H. ; Hughlett, C. ; Hanan, J.C. ; Chao, T.-H.
Pub. info.:
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.87-94, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.233-237, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.109-114, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hanan, J.C. ; Ustundag, E. ; Clausen, B. ; Sivasambu, M. ; Beyerlein, I.J. ; Brown, D.W. ; Bourke, M.A.M.
Pub. info.:
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002. pp.907-912, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Hanan, J.C. ; Aydiner, C.C. ; Ustundag, E. ; Swift, G.A. ; Kaldor, S.K. ; Cevdet Noyan, I.
Pub. info.:
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002. pp.919-924, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Hanan, J.C. ; Clausen, B. ; Swift, G.A. ; Ustundag, E. ; Beyerlein, I.J. ; Almer, Jonathan D. ; Lienert, U. ; Haeffner, D.R.
Pub. info.:
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002. pp.913-918, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.13-16, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering