1.

Conference Proceedings
Conference Proceedings
1. Comparison of radiation-induced transmission degradation of borosilicate crown optical glass from four different manufacturers (Invited Paper) [5897-19]
Gusarov, A. ; Doyle, D. ; Glebov, L. ; Berghmans, F.
Pub. info.: Photonics for space environments X : 1-2 August 2005, San Diego, California, USA.  pp.58970I-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5897
2.

Conference Proceedings
Conference Proceedings
2. Measured radiation sensitivity of silica-on-silicon and silicon-on-insulator micro-photonic devices for potential space application (Invited Paper) [5897-13]
Dumon, P. ; Kappeler, R. ; Barros, D. ; McKenzie, I. ; Doyle, D. ; Baets, R.
Pub. info.: Photonics for space environments X : 1-2 August 2005, San Diego, California, USA.  pp.58970D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5897
3.

Conference Proceedings
Conference Proceedings
3. THE CONTROL OF BORON AUTO-DOPING DURING DEVICE PROCESSING FOR P/P+ EPI WAFERS WITH NO BACK-SURFACE OXIDE SEAL
Binns, M.I. ; Kommu, S. ; Seacrist, M.R. ; Standley, R.W. ; Wise, R. ; Myers, D.J. ; Tisserand, D. ; Doyle, D.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.682-693,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
4.

Conference Proceedings
Conference Proceedings
4. Excimer laser patterning of TiN film from metal sacrificial layers
Dowling, A. ; Ghantasala, M.K. ; Hayes, J.P. ; Harvey, E.C. ; Doyle, D.
Pub. info.: Device and process technologies for MEMS and Microelectronics II : 17-19 December 2001, Adelaide, Australia.  pp.481-488,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4592
5.

Conference Proceedings
Conference Proceedings
5. Dynamic holography for the space qualification of large reflectors [5965-32]
Thizy, C. ; Stockman, Y. ; Doyle, D. ; Lemaire, P. ; Houbrechts, Y. ; Georges, M. ; Mazzoli, A. ; Mazy, E. ; Tychon, I. ; Ulbrich, G.
Pub. info.: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.59650W-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5965
6.

Conference Proceedings
Conference Proceedings
6. The Impact of Rapid Thermal Annealing on the Properties of the Si (100)-SiO2 Interface
Hurley, P. K. ; Leveugle, C. ; Mathewson, A. ; Doyle, D. ; Whiston, S. ; Prendergast, J. ; Lundgren, P.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.659-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
7.

Conference Proceedings
Conference Proceedings
7. Multilayer Structure, Stress Reduction and Annealing of Carbon Film
Ha, Peter C.T. ; McKenzie, D.R. ; Doyle, D. ; McCulloch, D.G. ; Wubrer, Richard
Pub. info.: Mechanical properties of nanostructured materials and nanocomposites : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.149-156,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 791
8.

Conference Proceedings
Conference Proceedings
8. THE CONTROL OF BORON AUTO-DOPING DURING DEVICE PROCESSING FOR P/P+ EPI WAFERS WITH NO BACK-SURFACE OXIDE SEAL
Binns, M.J. ; Kommu, S. ; Seacrist, M.R. ; Standley, R.W. ; Wise, R. ; Myers, D.J. ; Tisserand, D. ; Doyle, D.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.682-693,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
9.

Conference Proceedings
Conference Proceedings
9. A New Guideline on Contamination Control for Space Optical Instruments
Plesseria, I.Y. ; Henrist, M. ; Doyle, D.
Pub. info.: Proceedings, 4th International Symposium on Environmental Testing for Space Programmes, Palais des Congrès, Li ège, Belgium, 12-14 June 2001.  pp.129-134,  2001.  Noordwijk, the Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 467
10.

Conference Proceedings
Conference Proceedings
10. Canister-free videogrammetry system for thermal vacuum and space applications
Roose, S. ; Stockman, Y. ; Bosee, J.-C. ; Doyle, D. ; Ulbrich, G.
Pub. info.: Recent Developments in Traceable Dimensional Measurements II.  pp.242-252,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5190