1.

Conference Proceedings

Conference Proceedings
Jiang, M. ; Zhou, T. ; Cheng, J. ; Cong, W. ; Wang, G.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.63180E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
2.

Conference Proceedings

Conference Proceedings
Lv, Y. ; Tian, J. ; Li, H. ; Luo, J. ; Cong, W. ; Wang, G. ; Kumar, D.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.63180I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
3.

Conference Proceedings

Conference Proceedings
Lv, Y. ; Tian, J. ; Luo, J. ; Li, H. ; Cong, W. ; Wang, G. ; Yang, W.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.63181L-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
4.

Conference Proceedings

Conference Proceedings
Cong, W. ; Wang, G.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.631826-631827,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
5.

Conference Proceedings

Conference Proceedings
Li, J. ; Xu, D. ; Cong, W.
Pub. info.: Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China.  pp.402-406,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5253
6.

Conference Proceedings

Conference Proceedings
Kumar, D. ; Cong, W. ; Bohenkamp, F. ; Kakaday, T. ; Taft, P. ; Wang, L.V. ; McLennan, G. ; Hoffman, E.A. ; Wang, G.
Pub. info.: Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA.  pp.687-693,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5535
7.

Conference Proceedings

Conference Proceedings
Cong, W. ; Kumar, D. ; Liu, Y. ; Cong, A. ; Wang, G.
Pub. info.: Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA.  pp.679-686,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5535
8.

Conference Proceedings

Conference Proceedings
Liu, W. ; Gao, Q. ; Cong, W. ; Guo, J. T.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, Chin.  pp.829-832,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(1)
9.

Conference Proceedings

Conference Proceedings
Cong, W. ; Kumar, D. ; Kang, Y. ; Sinn, P. ; Nixon, E. ; Mienel, Jr., J. ; Suter, M.J. ; Wang, L.V. ; McLennan, G. ; Hoffman, E.A. ; Wang, G.
Pub. info.: Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA.  pp.212-219,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5535
10.

Conference Proceedings

Conference Proceedings
Kumarj, D. ; Cong, W. ; Thiesse, J. ; Nixon, E. ; Meinel, Jr., J. ; Cong, A. ; McLennan, G. ; Hoffman, E. A. ; Ming, J. ; Wang, G.
Pub. info.: Medical Imaging 2005: Visualization, Image-Guided Procedures, and Display.  pp.741-747,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5744