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Conference Proceedings
Wang, X. ; Xu, J. ; Zhu, Y. ; Yu, B. ; Han, M. ; Wang, Z. ; Cooper, K. L. ; Pickrell, G. R. ; Wang, A. ; Ringshia, A. ; Ng, W.
Pub. info.:
Sensors for Harsh Environments II . pp.59980L-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5998
2.
Conference Proceedings
Shen, F. ; Huang Z. ; Zhu, Y. ; Coffey, M. ; Frank, R. ; Pickrell, G. ; Wang, A.
Pub. info.:
Sensors for Harsh Environments II . pp.59980H-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5998
3.
Conference Proceedings
Chen, X. ; Yu, B. ; Zhu, Y. ; Wang, A.
Pub. info.:
Micromachining and Microfabrication Process Technology IX . pp.128-136, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5342
4.
Conference Proceedings
Zhu, Y. ; Pickrell, G. ; Wang, X. ; Xu, J. ; Yu, B. ; Han, M. ; Cooper, K. L. ; Wang, A. ; Ringshia, A. ; Ng, W.
Pub. info.:
Sensors for Harsh Environments . pp.11-18, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5590
5.
Conference Proceedings
Xu, J. ; Pickrell, G. ; Yu, B. ; Han, M. ; Zhu, Y. ; Wang, X. ; Cooper, K. L. ; Wang, A.
Pub. info.:
Sensors for Harsh Environments . pp.1-10, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5590
6.
Conference Proceedings
Zhu, Y. ; Huang, Z. ; Han, M. ; Shen, F. ; Pickrell, G. ; Wang, A.
Pub. info.:
Sensors for Harsh Environments . pp.19-26, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5590