1.

Conference Proceedings
Conference Proceedings
1. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY
Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.906-911,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
2.

Conference Proceedings
Conference Proceedings
2. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY
Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.906-911,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
3.

Conference Proceedings
Conference Proceedings
3. Polarization-insensitive MQW superluminescent emitting diodes
Li, T.N. ; Wang, J. ; Feng, Y. ; Jin, J. ; Zhu, W. ; Tang, Y. ; Xu, W. ; Huang, T. ; Eu, D.
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine VIII : 26-28 January 2004, San Jose, California, USA.  pp.332-339,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5316
4.

Conference Proceedings
Conference Proceedings
4. Ultrabroad-bandwidth and high-power superluminescent light-emitting diodes
Wang, J. ; Li, L. T. ; Xu, W. ; Yu, R. ; Ramalingam, J. ; Wu, Z. ; Zhu, W. ; Li, X.
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine IX : 23-26 January 2005, San Jose, California, USA.  pp.531-539,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5690