1.

Conference Proceedings
Conference Proceedings
1. Deep levels in Hg1-x CdxTe using mobility and carrier concentration
Li,X. ; Hu,X. ; Lu,H. ; Zhao,J. ; Fang,J.
Pub. info.: Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China.  pp.71-76,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3553
2.

Conference Proceedings
Conference Proceedings
2. Effect of gamma irradiation on room-temperature SWIR HgCdTe photodiodes
Hu,X. ; Li,X. ; Lu,H. ; Zhao,J. ; Gong,H. ; Fang,J.
Pub. info.: Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China.  pp.85-89,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3553
3.

Conference Proceedings
Conference Proceedings
3. Forward current-voltage characteristics of HgCdTe p-on-n photodiodes
Li,X. ; Zhao,J. ; Lu,H ; Fang,J. ; Xia,Y.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.601-607,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
4.

Conference Proceedings
Conference Proceedings
4. Short-wavelength infrared HgCdTe photovoltaic detectors fabricated by boron implantation
Zhao,J. ; Wang,Q. ; Fang,J.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.618-622,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
5.

Conference Proceedings
Conference Proceedings
5. Solar panel substrate planeness measuring system by an optical triangulation method
Fang,J. ; Zhao,J. ; Zhu,S.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.62-66,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221