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11 results

Conference Proceedings

1. Integral smoothing operation of composite B-spline surfaces

Huang,Z. ; Wang,Q. ; Zhou,J. ; Yu,J.

Pub. info.:	Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China. pp.158-163, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2644

Conference Proceedings

2. In-situ annealing during the growth of relaxed SiGe

Li,D. ; Huang,C. ; Cheng,B. ; Wang,H. ; Yu,Z. ; Zhang,C. ; Yu,J. ; Wang,Q.

Pub. info.:	Optical and infrared thin films : 1 August 2000, San Diego, USA. pp.93-99, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4094

Conference Proceedings

3. Model of dislocations at the interface of bonded wafers

Han,W. ; Yu,J. ; Wang,L. ; Wei,H. ; Zhang,X. ; Wang,Q.

Pub. info.:	Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.116-119, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4225

Conference Proceedings

4. SiGe/Si quantum well resonant-cavity-enhanced photodetector

Li,C. ; Yang,Q. ; Wang,H. ; Zhu,J. ; Luo,L. ; Yu,J. ; Wang,Q.

Pub. info.:	Terahertz and gigahertz electronics and photonics II : 31 July - 2 August 2000, San Diego, USA. pp.54-59, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4111

Conference Proceedings

5. Novel profilometer with dual digital length gauge for large aspheric measurements

Wang,Q. ; Zhang,Z. ; Zhang,X. ; Yu,J.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.39-46, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

Conference Proceedings

6. Preparation and characterization of erbium-doped sol-gel silica glasses

Lei,H. ; Yang,Q. ; Ou,H. ; Chen,B. ; Yu,J. ; Wang,Q. ; Xie,D. ; Wu,J. ; Xu,D. ; Xu,G.

Pub. info.:	Rare-earth-doped materials and devices III : 27-28 January 1999, San Jose, California. pp.74-80, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3622

Conference Proceedings

7. Recent progress on asphere manufacturing and testing at CIOM

Zhang,X. ; Zhang,Z. ; Wang,Q. ; Yu,J.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.24-31, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

Conference Proceedings

8. GaP/Si heterostructures grown by GS-MBE

Yu,J. ; Cheng,B. ; Yu,Z. ; Wang,Q.

Pub. info.:	Integrated Optoelectronics II. pp.9-12, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3551

Conference Proceedings

9. Preparation and photoluminescence of nc-Si/SiO2 MQW

Cheng,B. ; Yu,J. ; Yu,Z. ; Lei,Z. ; Li,D. ; Wang,Q.

Pub. info.:	Integrated Optoelectronics II. pp.13-17, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3551

10.

Conference Proceedings

10. SPER and characteristics of Si1-yCy alloys

Yu,Z. ; Yu,J. ; Cheng,B. ; Lei,Z. ; Li,D. ; Wang,Q. ; Liang,J.

Pub. info.:	Integrated Optoelectronics II. pp.18-22, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3551

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