1.

Conference Proceedings

Conference Proceedings
Jiao, Y. ; Yu, Y. ; Lu, Z.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.371-379,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5188
2.

Conference Proceedings

Conference Proceedings
Yu, Y. ; Zhang, B. ; Jiao, Y.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.343-350,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5188
3.

Conference Proceedings

Conference Proceedings
Yu, Y. ; Lu, Z. ; Jiao, Y.
Pub. info.: Interferometry XII: Techniques and Analysis.  pp.332-341,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5531
4.

Conference Proceedings

Conference Proceedings
Lu, Z. ; Yu, Y. ; Jiao, Y.
Pub. info.: Interferometry XII: Techniques and Analysis.  pp.95-104,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5531