1.

Conference Proceedings

Conference Proceedings
Sridhar, L. ; Yin, W. ; Narh, K. A.
Pub. info.: ANTEC '99 Conference proceedings, New York City, May 2-6, 1999 : plastics bridging the millennia.  2  pp.2545-2549,  1999.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 45(2)
2.

Conference Proceedings

Conference Proceedings
Yin, W. ; Fillmore, W. ; Dempsey, K, J.
Pub. info.: Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California.  pp.713-720,  1999.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3678
3.

Conference Proceedings

Conference Proceedings
Zhang, X. ; Dong, S. ; Yin, W. ; Li, S. ; Gao, Z.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.588410-588410,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
4.

Conference Proceedings

Conference Proceedings
Sun, X. ; Zhang, W. ; Yin, W. ; Li, A.
Pub. info.: Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation.  pp.63582J-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6358
5.

Conference Proceedings

Conference Proceedings
Yin, W. ; Zhang, W. ; Sun, X.
Pub. info.: Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation.  pp.63584M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6358