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13 results

Conference Proceedings

1. In-situ single-wavelength ellipsometer for a vacuum chamber

Chegal,W. ; Ye,S. ; Cho,H.M. ; Lee,Y.W. ; Kim,S.H. ; Kwak,Y.K.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.15-18, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

2. Visual measurement on BGA chip leaders

Ye,S. ; Qiu,Y. ; Sun,C.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.110-113, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

3. Study on vision recognition,position,and orientation in a flexible automatic coordinate measuring system

Wang,Y. ; Wang,X. ; Ye,S.

Pub. info.:	Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.517-526, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2899

Conference Proceedings

4. Distributed control system in a car-body inspection station

Yang,X. ; Ren,D. ; Ye,S. ; Lu,H. ; Duan,J.

Pub. info.:	Smart structures and materials 1997 : Smart sensing, processing, and instrumentation : 3-5 March 1997, San Diego, California. pp.177-182, 1997. Bellingham. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3042

Conference Proceedings

5. Theodolite-based flexible 3D coordinate system and application in machine vision inspection system

Wu,M. ; Wang,X. ; Ye,S. ; Wang,C. ; Duan,J.

Pub. info.:	Smart structures and materials 1997 : Smart sensing, processing, and instrumentation : 3-5 March 1997, San Diego, California. pp.166-176, 1997. Bellingham. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3042

Conference Proceedings

6. Computer vision application for weld defect detection and evaluation

Liu,Y. ; Li,X. ; Ren,D. ; Ye,S. ; Wang,B. ; Sun,J.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.354-357, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

7. Pulsed laser diode optical fiber interferometer for absolute distance measurement

Wang,C. ; Xiao,H. ; Hong,H. ; Ye,S.

Pub. info.:	Fiber optic and laser sensors XIV : 7-9 August 1996, Denver, Colorado. pp.350-353, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2839

Conference Proceedings

8. Establishment and application of a model for a movable 3D coordinate measuring system

Wu,M. ; Wang,X. ; Wang,Z. ; Ye,S. ; Luo,M.

Pub. info.:	Second International Conference on Vibration Measurements by Laser Techniques : Advances and Applications, 23-25 September 1996, Ancona, Italy. pp.458-468, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2868

Conference Proceedings

9. Application of total distributed control system in car-body inspection

Yang,X. ; Ren,D. ; Wang,Z. ; Ye,S. ; Lu,H. ; Duan,J.

Pub. info.:	Second International Conference on Vibration Measurements by Laser Techniques : Advances and Applications, 23-25 September 1996, Ancona, Italy. pp.481-486, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2868

10.

Conference Proceedings

10. X-ray diffraction analysis of crystallization of SbxSey thin films

Bao,H. ; Ye,S. ; Yuan,B. ; Lan,M. ; Zhou,S. ; Wang,Q.

Pub. info.:	Optical thin films V : new developments : 30 July-1 August 1997, San Diego, California. pp.140-146, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3133

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