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Conference Proceedings

1. Structure and characteristic of porous silicon layer

G. Wei ; J. Feng ; Y. Zheng ; Y. Li

Pub. info.:	Second International Conference on Thin Film Physics and Applications : '94 TFPA : 15-17 April 1994, Shanghai, China. pp.142-146, 1994. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2364

Conference Proceedings

2. Preparation of polycrystalline HgI₂ films by PVD method under ultrasonic wave

Y. Zheng ; W. Shi ; G. Wei ; J. Qin ; S. Chen

Pub. info.:	Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China. pp.69842Y-1-69842Y-5, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6984

Conference Proceedings

3. Characterization of (001)-orientated polycrystalline α-HgI₂ films grown by hot wall physical vapor deposition

Y. Zheng ; W. Shi ; G. Wei ; J. Qin ; S. Chen

Pub. info.:	Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China. pp.69842X-1-69842X-4, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6984