2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments. 1 pp.71560O-1-71560O-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments. 2 pp.71561Z-1-71561Z-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China. pp.66211V-1-66211V-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
International Symposium on Photoelectronic Detection and Imaging 2007, laser, ultraviolet, and terahertz technology : 9-12 September 2007, Beijing China. pp.66221Q-1-66221Q-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
International Symposium on Photoelectronic Detection and Imaging 2007, laser, ultraviolet, and terahertz technology : 9-12 September 2007, Beijing China. pp.66221P-1-66221P-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Y. Zhao ; S. Jong ; Y. C. Pak ; K. S. Ryu ; C. Fan
Pub. info.:
Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China. pp.71600J-1-71600J-5, 2009. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering