1.

Conference Proceedings
Conference Proceedings
1. Analysis and measurement of thermal-electrical performance of microbolometer detector
L. Sun ; B. Chang ; J. Zhang ; Y. Qiu ; Y. Qian
Pub. info.: Optoelectronic materials and devices II.  2  pp.678231-1-678231-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6782
2.

Conference Proceedings
Conference Proceedings
2. Performance analysis and improvement of microbolometer imaging system
L. Sun ; J. Zhang ; B. Chang ; Y. Qiu ; Y. Qian
Pub. info.: International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China.  pp.66211N-1-66211N-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6621
3.

Conference Proceedings
Conference Proceedings
3. The relationship of image quality of image intensifier and the luminance of its background
Y. Qiu ; B. Chang ; L. Sun ; Y. Gao ; S. Tiang
Pub. info.: International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China.  pp.66210R-1-66210R-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6621
4.

Conference Proceedings
Conference Proceedings
4. Ambient light effect on the uniformity of image intensifier fluorescence screen brightness
Y. Qiu ; B. Chang ; L. Sun ; J. Zhang ; Y. Gao
Pub. info.: International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China.  pp.66210S-1-66210S-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6621
5.

Conference Proceedings
Conference Proceedings
5. Area source electron gun uniformity analysis
Y. Qiu ; B. Chang ; L. Sun ; J. Zhang ; Y. Gao
Pub. info.: International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China.  pp.66210H-1-66210H-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6621