1.

Conference Proceedings
Conference Proceedings
1. Integral imaging with variable image planes using polymer-dispersed liquid crystal layers
Y. Kim ; H. Choi ; J. Kim ; S.-W. Cho ; B. Lee
Pub. info.: Three-dimensional TV, video, and display V : 3-4 October, 2006, Boston, Massachusetts, USA.  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6392
2.

Conference Proceedings
Conference Proceedings
2. A thin 3D-2D convertible integral imaging system with a pinhole array on a polarizer
H. Choi ; Y. Kim ; S. Cho ; J. Kim ; B. Lee
Pub. info.: Three-dimensional TV, video, and display V : 3-4 October, 2006, Boston, Massachusetts, USA.  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6392
3.

Conference Proceedings
Conference Proceedings
3. The Formation Of Cu Nanofilm By Electrochemical ALD
J. Stickney ; J. Kim ; Y. Kim
Pub. info.: Electrochemical Processing in ULSI and MEMS 2.  pp.329-335,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(6)
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Conference Proceedings
Conference Proceedings
4. Studies of Cu Atomic Layer Replacement, Formed by Underpotential Deposits, to Form Pt Nanofilms Using Electrochemical Atomic Layer Epitaxy
J.L. Stickney ; Y. Kim ; J. Kim
Pub. info.: Solid-State Posters (General).  pp.41-48,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(30)
5.

Conference Proceedings
Conference Proceedings
5. Local Corrosion by Film Stress and Solution Temperature during CMP
M. Kang ; Y. Kim ; J. Kim
Pub. info.: Chemical Mechanical Polishing 9.  pp.33-37,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 13(4)
6.

Conference Proceedings
Conference Proceedings
6. All-Organic Thin Film Transistor Circuits with Ink-Jet Printed Electrodes
J. Kim ; T. Yoon ; Y. Kim
Pub. info.: Thin Film Transistors 9.  pp.261-265,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(9)
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Conference Proceedings
Conference Proceedings
7. Reticle CD error calibrated OPC model generation
Y. Kim ; J.-Y. Choi ; J.-D. Kim ; J. Kim ; J.-W. Han
Pub. info.: Optical Microlithography XXI.  3  pp.69243J-1-69243J-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6924
8.

Conference Proceedings
Conference Proceedings
8. Simultaneous defect inspection on the surface and in the interior of bare wafers using a simple knife-edge test
J. H. Lee ; Y. Kim ; J. Kim ; Y. Yoo
Pub. info.: Optical Design and Testing III.  1  pp.683417-1-683417-5,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6834
9.

Conference Proceedings
Conference Proceedings
9. New conjugated polymers with stabilized blue emission
H. Suh ; J. Kim ; Y. Jin ; S. Song ; Y. Kim
Pub. info.: Light-emitting diodes : research, manufacturing, and applications XII : 22-24 January 2008, San Jose, California, USA.  pp.691009-1-691009-12,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6910
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Conference Proceedings
Conference Proceedings
10. Improved viewing resolution of three-dimensional integral imaging using pinhole array on LC panel
Y. Kim ; J. Kim ; J.-M. Kang ; J.-H. Jung ; B. Lee
Pub. info.: Three-dimensional TV, video, and display VI : 11-12 September 2007, Boston, Massachusetts, USA.  pp.67780U-1-67780U-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6778