1.

Conference Proceedings
Conference Proceedings
1. Synthesis of III-Nx-V1-x Thin Films by N Ion Implantation
Yu, K.M. ; Walukiewicz, W. ; Shan, W. ; Wu, J. ; Beeman, J.W. ; Ager, J.W., III ; Haller, E.E. ; Ridgway, M.C.
Pub. info.: Ion beam synthesis and processing of advanced materials : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 647
2.

Conference Proceedings
Conference Proceedings
2. Electronic and Optical Properties of Energetic Particle-Irradiated In-rich InGaN
Li, S.X. ; Yu, K.M. ; Jones, R.E. ; Wu, J. ; Walukiewicz, W. ; Ager III, J.W. ; Shan, W. ; Haller, E.E. ; Lu, Hai ; Schaff, William J. ; Kemp, W.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.357-362,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
3.

Conference Proceedings
Conference Proceedings
3. Synthesis of III-Nx-V1-x Thin Films by N Ion Implantation
Yu, K.M. ; Walukiewicz, W. ; Shan, W. ; Wu, J. ; Beeman, J.W. ; Ager, J.W., III ; Haller, E.E. ; Ridgway, M.C.
Pub. info.: Microstructural processes in irradiated materials, 2000 : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 650
4.

Conference Proceedings
Conference Proceedings
4. Effect of oxygen on the electronic band structure of II-O-VI alloys
Shan, W. ; Walukiewicz, W. ; Yu, K.M. ; Ager III, J.W. ; Wu, J. ; Beeman, J. ; Scapulla, M.A. ; Dubon, O.D. ; Haller, E.E. ; Nabetani, Y. ; Becla, P.
Pub. info.: Physics and Simulation of Optoelectronic Devices XII.  pp.426-434,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5349