Courteville, A. ; Wilhelm, R. ; Delaveau, M. ; Garcia, F. ; de Vecchi, F.
Pub. info.:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.596510-596511, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering