1.

Conference Proceedings
Conference Proceedings
1. Progress in Understanding the Physics of Copper in Silicon
Istratov,A.A. ; Flink,C. ; Baluasubramanian,S. ; Weber,E.R. ; Hieslmair,H. ; McHugo,S.A. ; Hedemann,H. ; Seibt,M. ; Schroter,W.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.258-277,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings
Conference Proceedings
2. Gettering of Transition Metals in Multicrystalline Silicon
MeHugo,S.A. ; Hieslmair,H. ; Weber,E.R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1979-1984,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings
Conference Proceedings
3. Rate limiting mechanism of transition metal gettering in multicrystalline silicon
McHugo,S.A. ; Thompson,A.C. ; Imaizumi,M. ; Hieslmair,H. ; Weber,E.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1795-1800,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings
Conference Proceedings
4. A study of the copper-pair related centers in silicon
Istratov,A.A. ; Heiser,T. ; Hieslmair,H. ; Flink,C. ; Kruger,J. ; Weber,E.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.467-472,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Copper in silicon:quantitative analysis of internal and proximity gettering
McHugo,S.A. ; Heiser,T. ; Hieslmair,H. ; Flink,C. ; Weber,E.R. ; Myers,S.M. ; Petersen,G.A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.461-466,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings
Conference Proceedings
6. Precipitation of iron in FZ and CZ silicon
Hieslmair,H. ; Istratov,A.A. ; McHugo,S.A. ; Flink,C. ; Weber,E.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.449-454,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263