1.

Conference Proceedings

Conference Proceedings
Hoinkis,M. ; Baranowski,J. ; Dreszer,P. ; Weber,E.R. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.841-846,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Jager,N.D. ; Dreszer,P. ; Newman,N. ; Verma,A.K. ; Liiiental-Weber,Z. ; Weber,E.R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1599-1604,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Dreszer,P. ; Chen,W.M. ; Wasik,D. ; Walukiewicz,W. ; Liang,B.W. ; Tu,C.W. ; Weber,E.R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1081-1086,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147