Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA. pp.83-90, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of X rays generated from lasers and other bright sources : 31 July-1 August 1997, San Diego, California. pp.310-315, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.354-358, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.85-89, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Environmental monitoring and remediation technologies II : 20-22 September, 1999, Boston, Massachusetts. pp.393-399, 1999. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic sensors V : 6-7 November 1996, Beijing, China. pp.26-32, 1996. Bellingham, Wash. USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.247-250, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering