1.

Conference Proceedings
Conference Proceedings
1. Nanoscale deformation measurements to improve reliability assessment of sensors and MEMS [6179-19]
Michel, B. ; Keller, J. ; Walter, H.
Pub. info.: Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA.  pp.61790J-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6179
2.

Conference Proceedings
Conference Proceedings
2. Preparation and Characterization of Thin Cubic Boron Nitride Films
Bewilogua, K. ; Schutze, A. ; Walter, H. ; Kouptsidis, S.
Pub. info.: Proceedings of the Second Symposium on III-V Nitride Materials and Processes.  pp.134-141,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-34
3.

Conference Proceedings
Conference Proceedings
3. Magneto-Optical Study of Grain Boundaries, Interfaces, and Grain Boundary Networks in YBaCuO
Jooss, Ch. ; Kautschor, L.-O. ; Delamare, M.P. ; Bringmann, B. ; Guth, K. ; Born, V. ; Sievers, S. ; Walter, H. ; Dzick, J. ; Hoffmann, J. ; Freyhardt, H.C. ; Boer, B. de ; Holzapfel, B. ; Sandiumenge, F.
Pub. info.: High-temperature superconductors, crystal chemistry, processing and properties : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 659
4.

Conference Proceedings
Conference Proceedings
4. Factors in Cell Separation by Partitioning in Two-Polymer Aqueous-Phase Systems
Fisher, Derek ; Raymond, F. D. ; Walter, H.
Pub. info.: Cell separation science and technology.  pp.175-,  1991.  Washington, DC.  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 464
5.

Conference Proceedings
Conference Proceedings
5. Design methodology of microstructures for enhanced mechanical reliability [5852-51]
Wittler, O. ; Walter, H. ; Vogel, D. ; Keller, J. ; Michel, B.
Pub. info.: Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics.  pp.316-320,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5852