1.
Conference Proceedings
Walraven,J.A. ; Headley,T.J. ; Campbell,A.N. ; Tanner,D.M.
Pub. info.:
MEMS reliability for critical and space applications : 21-22 September 1999, Santa Clara, California . pp.30-39, 1999. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3880
2.
Conference Proceedings
Walraven,J.A. ; Soden,J.M. ; Tanner,D.M. ; Tangyunyong,P. ; Cole Jr.,E.I. ; Anderson,R.E. ; Irwin,L.W.
Pub. info.:
MEMS Reliability for Critical Applications . pp.30-39, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4180
3.
Conference Proceedings
Walraven,J.A. ; Mani,S.S. ; Fleming,J.G. ; Headley,T.J. ; Kotula,P.G. ; Pimentel,A.A. ; Rye,M.J. ; Tanner,D.M. ; Smith,N.F.
Pub. info.:
MEMS Reliability for Critical Applications . pp.49-57, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4180