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Conference Proceedings

1. Epitaxial Growth of 4H-SiC on 4o Off-Axis (0001) and (000-1) Substrates by Hot-Wall CVD

Wada, K. ; Kimoto, T. ; Nishikawa, K. ; Matsunami, H.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.219-222, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

2. Strain Tolerance and Microstructure of Thermal Barrier Coatings Produced by Electron Beam Physical Vapor Deposition Process

Wada, K. ; Ishiwata, Y. ; Yamaguchi, N. ; Matsubara, H.

Pub. info.:	High-temperature oxidation and corrosion 2005 : proceedings of the International Symposium on High-Temperature Oxidation and Corrosion 2005 , Nara, Japan, 30th November - 2nd December 2005. pp.267-276, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	522-523

Conference Proceedings

3. Improved Surface Morphology and Background Doping Concentration in 4H-SiC(0001) Epitaxial Growth by Hot-Wall CVD

Wada, K. ; Kimoto, T. ; Nishikawa, K. ; Matsunami, H.

Pub. info.:	Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy. pp.85-88, 2005. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	483-485

Conference Proceedings

4. FRACTIONAL CONTRIBUTION IN Si SELF-DIFFUSION: DOPANT CONCENTRATION AND TEMPERATURE DEPENDENCE ON Si SELF-DIFFUSION MECHANISM

Nakabayasbi, Y. ; Osman, H.I. ; Toyonaga, K. ; Yokota, K. ; Matsumoto, S. ; Murota, J. ; Wada, K. ; Abe, T.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.241-247, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

5. EFFECT OF VACANCY DOUBLE ACCEPTOR LEVEL ON Si SELF DIFFUSION UNDER HEAVY DOPING CONDITION

Osman, H.I. ; Nakabayashi, Y. ; Tomohisa, S. ; Toyonaga, K. ; Matsumoto, S. ; Murota, J. ; Wada, K. ; Abe, T.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.248-253, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

6. Defect Engineering for Silicon Microphotonics

Agarwal, A. ; Foresi, J.S. ; Giovane, L.M. ; Liao, L. ; Michel, J. ; Wada, K. ; Kimerling, L.C.

Pub. info.:	Proceedings of the Third International Symposium on Defects in Silicon. pp.215-224, 1999. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-1

Conference Proceedings

7. On-chip interconnection beyond semiconductor roadmap: silicon microphotonics (Invited Paper)

Wada, K. ; Luan, H.-C. ; Lim, D.R.C. ; Kimerling, L.C.

Pub. info.:	Active and passive optical components for WDM communications II : 29 July-1 August 2002, Boston, USA. pp.437-443, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4870

Conference Proceedings

8. PREPARATION OF THE POROUS SUPPORTS WITH SiO2-ZrO2-Na2O COMPOSITION

Tsurita, Y. ; Wada, K.

Pub. info.:	Better ceramics through chemistry IV : symposium held April 16-20, 1990, San Francisco, California, U.S.A.. pp.361-364, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	180

Conference Proceedings

9. *PRECIPITATION OF OXYGEN AND THE MECHANISH OF STACKING FAULT FORMATION IN CZOCHRALSKI SILICON BULK CRYSTALS,

Wada, K. ; Inoue, N. ; Osaka, J.

Pub. info.:	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.125-140, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	14

10.

Conference Proceedings

10. A HIGH RESOLUTION CATHODOLUMINESCENCE (LC-CL) STUDY ON GaAs-AlGaAs INTERFACE

Wada, K. ; Korez, A. ; Inoue, N.

Pub. info.:	Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A.. pp.437-442, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	138

11.

Conference Proceedings

11. Spectroscopic Studies in InGaN Quantum Wells

Chichibu, S. F. ; Sota, T. ; Wada, K. ; DenBaars, S. P. ; Nakamura, S.

Pub. info.:	GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.. pp.G2.7.1-, 1999. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	537

12.

Conference Proceedings

12. Electronically-Enhanced Reaction of Process-Induced Defects in GaAs

Wada, K. ; Nakanishi, H. ; Yamada, K. ; Kimerling, L. C.

Pub. info.:	Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.201-, 1998. Warrendale, Pa. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	510

13.

Conference Proceedings

13. Photonic Bandgap Formation by Wafer Bonding and Delamination

Wada, K. ; Chen, T. ; Michel, J. ; Kimerling, L. C. ; Aga, H. ; Mitani, K. ; Abe, T. ; Suezawa, M.

Pub. info.:	III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.121-, 1999. Warrendale, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	535

14.

Conference Proceedings

14. Surface smoothing of polycrystalline Si waveguides with gas-cluster ion beams

Toyoda, N. ; Lee, K. K. ; Luan, H-C. ; Lim, D. R. ; Agarwal, A. M. ; Wada, K. ; Kimerling, L. C. ; Allen, L. P. ; Fenner, D. B. ; Kirkpatrick A. R.

Pub. info.:	Thin films for optical waveguide devices and materials for optical limiting : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.. pp.51-, 2000. Warrendale, PA. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	597

15.

Conference Proceedings

15. Field Drift of Plasma-Induced Defects in Phosphorous-Doped Si by Reverse Bias Annealing (RBA)

Takeuchi, J. ; Zaitsu, Y. ; Shimizu, T. ; Matsumoto, S. ; Wada, K.

Pub. info.:	Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.81-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	442

16.

Conference Proceedings

16. Donor Reactivation in Plasma-Irradiated GaAs Under Laser Illumination

Wada, K. ; Nakanishi, H.

Pub. info.:	Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.69-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	442

17.

Conference Proceedings

17. Localized Excitons in InGaN

Chichibu, S. ; Deguchi, T. ; Sota, T. ; Wada, K. ; Nakamura, S.

Pub. info.:	Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.613-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	482

18.

Conference Proceedings

18. Theoretical Investigation Of Nitrogen-Doping Effect On Native Defect Aggregation Processes In Silicon

Kageshima, H. ; Taguchi, A. ; Wada, K.

Pub. info.:	Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.79-88, 2002. Warrendale, Pa. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	719

19.

Conference Proceedings

19. Determination of Diffusivities of Si Self-Diffusion and Si Self-Interstitials using Isotopically Enriched Single- or Multi-30Si Epitaxial Layers

Matsumoto, S. ; Aid, S.R. ; Sakaguchi, T. ; Toyonaga, K. ; Nakabayashi, Y. ; Sakuraba, M. ; Shimamune, Y. ; Hashiba, Y. ; Murota, J. ; Wada, K. ; Abe, T.

Pub. info.:	Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.425-436, 2005. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	864

20.

Conference Proceedings

20. Fabrication of Self-Organized Titania Nanostructures on Glass by Combinational Anodizing Technology

Chu, S. Z. ; Inoue, S. ; Wada, K. ; Hishita, S.

Pub. info.:	Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium. pp.79-90, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2004-19

21.

Conference Proceedings

21. Gas-Sensing Properties of Pd/SnO2 Sensor Subjected to Surface Chemical Modification with Diethoxydimethylsilane

Wada, K. ; Egashira, M.

Pub. info.:	Chemical sensors IV : proceedings of the symposium. pp.282-292, 1999. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-23

22.

Conference Proceedings

22. FRACTIONAL CONTRIBUTION IN Si SELF-DIFFUSION: DOPANT CONCENTRATION AND TEMPERATURE DEPENDENCE ON Si SELF-DIFFUSION MECHANISM

Nakabayasbi, Y. ; Osman, H.I. ; Toyonaga, K. ; Yokota, K. ; Matsumoto, S. ; Murota, J. ; Wada, K. ; Abe, T.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.241-247, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

23.

Conference Proceedings

23. EFFECT OF VACANCY DOUBLE ACCEPTOR LEVEL ON Si SELF DIFFUSION UNDER HEAVY DOPING CONDITION

Osman, H.I. ; Nakabayashi, Y. ; Tomohisa, S. ; Toyonaga, K. ; Matsumoto, S. ; Murota, J. ; Wada, K. ; Abe, T.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.248-253, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

24.

Conference Proceedings

24. Production of Thermal Positronium for Laser Cooling of Ortho-Positronium

Iijima, H. ; Asonuma, T. ; Hirose, T. ; Irako, M. ; Kadoya, K. ; Kajita, M. ; Kumita, T. ; Matsumoto, B. ; Mondal, N.N. ; Wada, K.

Pub. info.:	Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany. pp.670-672, 2001. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	363-365

25.

Conference Proceedings

25. Crystallographic Growth Models of Wurtzite-Type Thin Films on 6H-SiC

Ohsato, H. ; Wada, K. ; Kato, T. ; Sun, C.J. ; Razeghi, M.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1489-1492, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

26.

Conference Proceedings

26. Strain Relaxation During Heteroepitaxy on Twist-Bonded Thin Gallium Arsenide Substrates

Kopperschmidt, P. ; Senz, St. ; Scholz, R. ; Kastner, G. ; Gosele, U. ; Velling, P. ; Prost, W. ; Tegude, F-J. ; Gottschalch, V. ; Wada, K.

Pub. info.:	III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.45-, 1999. Warrendale, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	535

27.

Conference Proceedings

27. Cathodoluminescence Study of GaAs Based Nano-Structures

Wada, K. ; Koshiba, S. ; Noge, H. ; Akiyama, H. ; Sakaki, H.

Pub. info.:	Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII). pp.332-335, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	95-6

28.

Conference Proceedings

28. Crystallographic Growth Models of Wurtzite-Type Thin Films on 6H-SiC

Ohsato, H. ; Wada, K. ; Kato, T. ; Sun, C.J. ; Razeghi, M.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1489-1492, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

29.

Technical Paper

29. Discharge structure in disk MHD generator with Ar/Cs

Suzuki, M. ; Yamaguchi, N. ; Wada, K. ; Okubo, M. ; Okuno, Y. ; Yamasaki, H.

Pub. info.:	AIAA paper. pp.1-8, 1998. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA Fluid Dynamics Conference
Ser. no.:	1998

30.

Technical Paper

30. Oxidation behavior of ceramics for gas turbines in combustion gas flow at 1500｡?C

Etori, Y. ; Hisamatsu, T. ; Yuri, I. ; Yasutomi, Y. ; Machida, T. ; Wada, K.

Pub. info.:	A.S.M.E. paper. 1997. New York. The American Society of Mechanical Engineers
Title of ser.:	ASME Technical Paper : GT
Ser. no.:	1997

31.

Technical Paper

31. Development of ceramic components for a power generating gas turbine

Hara, Y. ; Tsuchiya, T. ; Maeda, F. ; Tsuji, I. ; Wada, K.

Pub. info.:	A.S.M.E. paper. 1991. New York, NY. The American Society of Mechanical Engineers
Title of ser.:	ASME Technical Paper : GT
Ser. no.:	1991

32.

Technical Paper

32. Development of gas turbine for air-blown gasification

Wada, K. ; Sasada, T. ; Hayashi, H.

Pub. info.:	A.S.M.E. paper. 1996. New York. The American Society of Mechanical Engineers
Title of ser.:	ASME Technical Paper : GT
Ser. no.:	1996

33.

Technical Paper

33. Development of a cobalt base superalloy for heavy duty gas turbine nozzles

Sato, M. ; Kobayashi, Y. ; Matsuzaki, H. ; Shimomura, K. ; Shibata, T. ; Nakamura, S. ; Fukui, Y. ; Wada, K.

Pub. info.:	A.S.M.E. paper. 1996. New York. The American Society of Mechanical Engineers
Title of ser.:	ASME Technical Paper : GT
Ser. no.:	1996

34.

Technical Paper

34. High temperature strength of large size SC and DS buckets for industrial gas turbines

Sato, M. ; Kobayashi, Y. ; Matsuzaki, H. ; Tamaki, H. ; Yoshinari, A. ; Iijima, K. ; Fukui, Y. ; Kodama, H. ; Wada, K.

Pub. info.:	A.S.M.E. paper. 1995. New York. The American Society of Mechanical Engineers
Title of ser.:	ASME Technical Paper : GT
Ser. no.:	1995

35.

Technical Paper

35. Development of New Type Condenser (Super Multi Flow Condenser) Having Inner Fin Tube.

Sakano, A. ; Kado, H. ; Wada, K. ; Iino, Y.

Pub. info.:	2002 SAE world congress : technical paper. 2002. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2002

36.

Technical Paper

36. HVAC Blower Aeroacoustic Predictions.

Norisada, K. ; Sakai, M. ; Ishiguro, S. ; Kawaguchi, M. ; Perot, F. ; Wada, K.

Pub. info.:	2013 SAE world congress : technical paper. 2013. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2013

37.

Technical Paper

37. Study on Emission Reducing Method with New Lean NOx Catalyst for Diesel Engines.

Wada, K. ; Suzuki, N. ; Satoh, N. ; Morita, T. ; Yamaguchi, S.

Pub. info.:	2007 International Fuels and Lubricants Meeting : SAE technical paper. 2007. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2007

38.

Technical Paper

38. Study on Low NOx Emission Control Using Newly Developed Lean NOx Catalyst for Diesel Engines.

Morita, T. ; Suzuki, N. ; Satoh, N. ; Wada, K. ; Ohno, H.

Pub. info.:	2007 SAE world congress : technical paper. 2007. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2007

39.

Conference Proceedings

39. Monolithic Si-based technology for optical receiver circuits (Invited Paper)

Cannon, D.D. ; Luan, H.-C. ; Danielson, D.T. ; Jongthammanurak, S. ; Liu, J. ; Michel, J. ; Wada, K. ; Kimerling, L.C.

Pub. info.:	Quantum Sensing: Evolution and Revolution from Past to Future. pp.145-155, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4999

40.

Conference Proceedings

40. Air trench waveguide bend for high-density optical integration

Akiyama, S. ; Wada, K. ; Michel, J. ; Kimerling, L.C. ; Popovic, M.A. ; Haus, H.A.

Pub. info.:	Integrated Optics: Devices, Materials, and Technologies VIII. pp.14-21, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5355

41.

Conference Proceedings

41. Electronics and photonics convergence on Si CMOS platform

Wada, K.

Pub. info.:	Optoelectronic Integration on Silicon. pp.16-24, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5357

42.

Conference Proceedings

42. Micron-size bending radii in silica-based waveguides

Popovic, M. ; Wada, K. ; Akiyama, S. ; Haus, H.A. ; Michel, J.

Pub. info.:	Integrated Optics: Devices, Materials, and Technologies VI. pp.54-63, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4640

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