1.

Conference Proceedings
Conference Proceedings
1. Influence of annealing environment on the hydrogen related bonding structure in silicon nitride thin films containing silicon nanoparticles
W. Ding ; W. Qi ; W. Lu ; Z. Zhang ; W. Yu
Pub. info.: Optoelectronic Materials and Devices III.  2  pp.71353X-1-71353X-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7135
2.

Conference Proceedings
Conference Proceedings
2. Deposition of nanocrystalline SiC films using helicon wave plasma enhanced chemical vapor deposition
W. Lu ; W. Yu ; L. Ma ; L. Wu ; G. Fu
Pub. info.: Optoelectronic Materials and Devices III.  2  pp.71353F-1-71353F-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7135
3.

Conference Proceedings
Conference Proceedings
3. Optical properties of protocrystalline silicon/amorphous SiC multilayer films
G. Fu ; L. Ma ; W. Lu ; Z. Zhang ; W. Yu
Pub. info.: Optoelectronic Materials and Devices III.  2  pp.713540-1-713540-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7135
4.

Conference Proceedings
Conference Proceedings
4. Plasmon-enhanced luminescence from nanocrystalline SiC films through adjusting spacer layer thickness
W. Yu ; J. Yu ; W. Lu ; Y. Bian ; C. Wang
Pub. info.: Optoelectronic Materials and Devices III.  2  pp.71354E-1-71354E-7,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7135
5.

Conference Proceedings
Conference Proceedings
5. Structural and optical properties of doped silicon nanocrystals : first-principles calculation
G. Fu ; H. Gao ; W. Lu ; W. Ding ; W. Yu
Pub. info.: Nanophotonics, nanostructure, and nanometrology II : 12-14 November 2007, Beijing, China.  pp.68311E-1-68311E-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6831